1982
DOI: 10.1002/pssa.2210710227
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Some electrical characteristics of Cu- and in-doped CuInTe2

Abstract: A detailed study is made on the effects of annealing CuInTe, single crystals, both in vacuum and in the presence of elemental Cu and In. The variation of hole concentration with temperature is established and the acceptor state ionization energy is found to lie between 10 and 14 meV. This energy state is associated with the In vacancy. Mobility data are obtained and explained by taking into account various carrier scattering mechanisms including, ionized impurity, acoustic mode phonon, and space charge effects… Show more

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Cited by 35 publications
(9 citation statements)
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“…Increase of R H with 1/T confirms that in this ªhighº temperature range, conduction due to an activation mechanism is predominant, and an acceptor level around 5 to 25 meV is estimated, which agrees quite well with the reported values [10]. R H then starts to decrease after passing through the maximum as the temperature is further lowered and then remains very nearly constant.…”
Section: Resultssupporting
confidence: 80%
“…Increase of R H with 1/T confirms that in this ªhighº temperature range, conduction due to an activation mechanism is predominant, and an acceptor level around 5 to 25 meV is estimated, which agrees quite well with the reported values [10]. R H then starts to decrease after passing through the maximum as the temperature is further lowered and then remains very nearly constant.…”
Section: Resultssupporting
confidence: 80%
“…1 we plot for comparison the change of p with the 10 3 /T of samples of the corresponding 1:1:2 phase that have the lowest carrier concentration reported. 10,11 Their values at 300 K are also shown in Table I together with the present data. A trend that indicates the carrier concentration of these ODCs is smaller by at least two orders of magnitude is observed.…”
mentioning
confidence: 75%
“…Mechanical, thermal, and electrical contacts to the samples were made by first depositing a thin film of copper by electroplating which was used as a base for soldering with pure indium. Although the instability of Cu contacts with p-type CuInSe, [16] has been reported, i.e. the electrical conductivity changes with time a t room temperature, no such effect was observed with n-type samples.…”
Section: Experimental Methodsmentioning
confidence: 90%