2004
DOI: 10.1016/j.sna.2003.12.012
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Some design considerations on the electrostatically actuated microstructures

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Cited by 173 publications
(139 citation statements)
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“…The relative errors of results obtained from ALM are comparable to those in [17] and [16], for all cases of finite element approximations. In fact, it appears …”
Section: Numerical Testssupporting
confidence: 53%
See 1 more Smart Citation
“…The relative errors of results obtained from ALM are comparable to those in [17] and [16], for all cases of finite element approximations. In fact, it appears …”
Section: Numerical Testssupporting
confidence: 53%
“…Hu, Chang and Huang [17] first studied such a problem in 2004. The structure [17] can be schematically described as a thin metal beam hanging over a substrate separated by some insulator, where one end of the microbeam is fixed and the other is free (fixed-free beam). The beam is pulled (deflected) towards the substrate when a voltage is applied between the beam and the substrate.…”
Section: Numerical Testsmentioning
confidence: 99%
“…Determination of the pull-in voltage is critical in the design of MEMS devices. Accurate determination of pull-in voltage is very challenging in virtue of the electromechanical coupling effect and the nonlinearity of electrostatic force [3,4]. Effects such as the fringing field and the initial residual stress further complicate the modeling.…”
Section: Introductionmentioning
confidence: 99%
“…Lump model estimates the pull-in limit as one-third of the initial gap (d/3). However, experimental part of a study showed that pull-in limit is at a different value (Hu et al, 2004). Hu et al utilized a linearized governing equation of a cantilever to demonstrate their analytical approach.…”
Section: Introductionmentioning
confidence: 99%