Some Applications of high‐energy, high‐resolution Auger electron spectroscopy using bremsstrahlung radiation

Kövér, L.; Varga, D.; Cserny, I.; Tóth, J.; Tőkési, K.

doi:10.1002/sia.740190106

Cited by 114 publications

(33 citation statements)

References 15 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…32 The analyzer works in a fixed retardation ratio mode with a relative energy resolution of 5×10 -3 . In the present experiments the used pass energies were around 100 eV, and in this way the analyzer energy resolution was around 0.5 eV.…”

Section: -21mentioning

confidence: 99%

Absolute determination of optical constants by reflection electron energy loss spectroscopy

Tóth

et al. 2017

Phys. Rev. B

Self Cite

View full text Add to dashboard Cite

We present an absolute extraction method of optical constants of metal from the measured reflection electron energy loss (REELS) spectra by using the recently developed reverse Monte Carlo (RMC) technique. The method is based on a direct physical modeling of electron elastic and electron inelastic scattering near the surface region where the surface excitation becomes important to fully describe the spectrum loss feature intensity in relative to the elastic peak intensity. An optimization procedure of oscillator parameters appeared in the energy loss function (ELF) for describing electron inelastic scattering due to the bulk-and surfaceexcitations was performed with the simulated annealing method by a successive comparison between the measured and Monte Carlo simulated REELS spectra. The ELF and corresponding optical constants of Fe were obtained from the REELS spectra measured at incident energies of 1000, 2000 and 3000 eV. The validity of the present optical data has been verified with the f-and ps-sum rules showing the accuracy and applicability of the present approach. Our data are also compared with previous optical data from other sources.There is a continuous interest and effort on the determination of optical constants of solids due to their importance in both fundamental researches and applications. Optical methods based on reflectance and absorption spectroscopy with ellipsometry were extensively employed up to now and the measured data for metals and semiconductors were compiled to form a database of optical constants.1,2 However, many materials still lack the data in the intermediate photon energy range around 20~50 eV. Furthermore, the available data usually consist of different energy regions measured by different groups and means and, a)

show abstract

Section: -21mentioning

confidence: 99%

Absolute determination of optical constants by reflection electron energy loss spectroscopy

Tóth

et al. 2017

Phys. Rev. B

Self Cite

View full text Add to dashboard Cite

show abstract

“…[14] The spectrometer consists of a 180 • hemispherical electrostatic analyzer with a 250-mm working radius, floatable up to 10 keV and completed with a multielement zooming electron-optical lens. During the measurements, the vacuum in the analysis chamber was better than 5 × 10 −9 mbar.…”

Section: Methodsmentioning

confidence: 99%

Insulator nanocapillary production from biological sample

Bereczky

Tőkési

Varga

et al. 2008

Surface & Interface Analysis

Self Cite

View full text Add to dashboard Cite

Diatoms are unicellular microscopic organisms with silicon dioxide-based cylindrical-shaped skeletons, enveloped with an organic material composed of essentially polysaccharides and proteins. By removing the organic compounds from the diatom, we present an alternative method for the preparation of insulating nanocapillaries. The lengths of the capillaries are about 100 µm and the diameters of the regularly structured pores are about 200 nm. Moreover, we confirm with measurements by XPS that the shell of the Pennales diatoms contains mostly SiO 2 .

show abstract

“…The ESA-31 spectrometer equipped with a high luminosity and high resolution analyser was applied [34]. The electron gun (type VG LEG62, V.G.…”

Section: Methodsmentioning

confidence: 99%

Influence of Recoil Effect and Surface Excitations on the Inelastic Mean Free Paths of Electrons in Polymers

et al. 2006

Self Cite

View full text Add to dashboard Cite

In this work, the influence of recoil effect and surface excitations on the inelastic mean free paths for polythiophenes is investigated. The inelastic mean free paths of electrons in polythiophenes are measured with the elastic peak electron spectroscopy method using the Ag standard and the electron elastic scattering cross-sections from the database NIST 3.1 in the electron kinetic energy range 200-5000 eV. The Monte Carlo model is applied for evaluating the electron backscattering intensities from the polymers and the Ag standard, as well as for evaluating electrons quasi-elastically backscattered from atoms of different atomic numbers (the recoil effect). The surface excitation corrections are accounted for using the formalism of Chen, with the material parameters for polythiophenes evaluated from the elastic peak electron spectroscopy method. Deviations due to recoil effect and surface excitations to the inelastic mean free paths are compared and discussed. Correction to the inelastic mean free paths due to recoil effect is considerable but is smaller, however, than the correction due to surface excitations. Accounting for recoil effect and surface excitations leads to improvement of the inelastic mean free paths, as compared to the inelastic mean free paths resulting from the predictive formulae of Gries.

show abstract

Some Applications of high‐energy, high‐resolution Auger electron spectroscopy using bremsstrahlung radiation

Cited by 114 publications

References 15 publications

Absolute determination of optical constants by reflection electron energy loss spectroscopy

Absolute determination of optical constants by reflection electron energy loss spectroscopy

Insulator nanocapillary production from biological sample

Influence of Recoil Effect and Surface Excitations on the Inelastic Mean Free Paths of Electrons in Polymers

Contact Info

Product

Resources

About