2015 IEEE International Electron Devices Meeting (IEDM) 2015
DOI: 10.1109/iedm.2015.7409773
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Solving the paradox of the inconsistent size dependence of thermal stability at device and chip-level in perpendicular STT-MRAM

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Cited by 37 publications
(24 citation statements)
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“…Thus far, STT-MRAM devices are larger than this scale. Recent experiments on large arrays of very uniform magnetic bits have found that the energy barrier (for fixed element thickness) scales with the element diameter (not the diameter squared) [146], consistent with the predictions of a recent micromagnetic model [144] and the reversal mode pictured in figure 19(b).…”
Section: Department Of Physics New York Universitysupporting
confidence: 58%
“…Thus far, STT-MRAM devices are larger than this scale. Recent experiments on large arrays of very uniform magnetic bits have found that the energy barrier (for fixed element thickness) scales with the element diameter (not the diameter squared) [146], consistent with the predictions of a recent micromagnetic model [144] and the reversal mode pictured in figure 19(b).…”
Section: Department Of Physics New York Universitysupporting
confidence: 58%
“…nm with excellent agreement with NEB simulations and chip data retention measurements at higher temperature without external field [92], solving the long-standing paradox of inconsistent behavior of thermal stability at larger dimensions.…”
Section: Information Storingsupporting
confidence: 59%
“…Extension of ∆ (H) model to domain-wall-mitigated switching was performed recently (eq. (2) in [92])) and evaluation of ∆ using this model showed that indeed thermal stability is increasing linearly with increasing dimensions even well above 40…”
Section: Information Storingmentioning
confidence: 87%
“…A similar feature was observed in two-terminal MTJ devices, where the volume of the whole recording layer governs the thermal stability only below a critical size characterized by the DW width. [129][130][131] Another intriguing feature of the result shown in Fig. 5 is that W crit increases as t mag decreases.…”
Section: Current-induced Dw Motionmentioning
confidence: 83%