Solution synthesis and dielectric properties of alumina thin films: understanding the role of the organic additive in film formation

Hoffmann, Rudolf C.; Liedke, Maciej Oskar; Butterling, Maik; Wagner, A.; Trouillet, Vanessa; Schneider, Jörg J.

doi:10.1039/d1dt01439k

Dalton Trans.

2021

DOI: 10.1039/d1dt01439k

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Solution synthesis and dielectric properties of alumina thin films: understanding the role of the organic additive in film formation

Rudolf C. Hoffmann

Maciej Oskar Liedke

Maik Butterling

et al.

Abstract: Positron annihilation spectroscopy is used to characterize pore size distributions in alumina thin films. Differences in the microstructure can be correlated to dielectric behaviour and insulating properties.

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Solution synthesis and dielectric properties of alumina thin films: understanding the role of the organic additive in film formation

Abstract: Positron annihilation spectroscopy is used to characterize pore size distributions in alumina thin films. Differences in the microstructure can be correlated to dielectric behaviour and insulating properties.

Cited by 0 publications

References 45 publications

No citations

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