2019
DOI: 10.1088/1361-6528/ab3606
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Solution-processed black phosphorus nanoflakes for integrating nonvolatile resistive random access memory and the mechanism unveiled

Abstract: In this study, we demonstrated the integration of black phosphorus (BP) nanoflakes in a resistive random access memory (RRAM) with a facile and complementary metal-oxide-semiconductor-compatible process. The solution-processed BP nanoflakes embedded in polystyrene (PS) as an active layer were sandwiched between aluminum electrodes (Al/BP:PS/Al). The device shows a figure of merit with typical bipolar behavior and forming-free characteristics as well as excellent memory performances such as nonvolatile, low ope… Show more

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Cited by 22 publications
(12 citation statements)
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“…By using Au as the electrodes, an oxidation−reduction (redox) reaction could be eliminated at the interface between the electrode and MCA− BP active layer, where a redox reaction is commonly observed in BP-based resistive random-access memory (RRAM) by using Al electrodes followed the formation of the amorphous aluminum oxide layer (AlO x ). 45 For the memristor, the active layer is composed of the MCA supramolecules incorporating BP nanosheets (Figure 4c), while the TS selector could be achieved by inserting an additional pure MCA layer as a tunneling barrier (Figure 4d). The optical microscopy of devices with crossbar structure in a memristor and their corresponding SEM and AFM images are provided in the Supporting Information (Figure S3).…”
Section: ■ Results and Discussionmentioning
confidence: 99%
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“…By using Au as the electrodes, an oxidation−reduction (redox) reaction could be eliminated at the interface between the electrode and MCA− BP active layer, where a redox reaction is commonly observed in BP-based resistive random-access memory (RRAM) by using Al electrodes followed the formation of the amorphous aluminum oxide layer (AlO x ). 45 For the memristor, the active layer is composed of the MCA supramolecules incorporating BP nanosheets (Figure 4c), while the TS selector could be achieved by inserting an additional pure MCA layer as a tunneling barrier (Figure 4d). The optical microscopy of devices with crossbar structure in a memristor and their corresponding SEM and AFM images are provided in the Supporting Information (Figure S3).…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…Thanks to the flexibility of stacking varied layers of the two-terminal sandwiched structure, we study the memristor (Au/MCA–BP/Au) and the TS selector (Au/MCA–BP/MCA/Au) by using our 2D-layered composite film self-assembly by BP nanosheets and MCA supramolecules. By using Au as the electrodes, an oxidation–reduction (redox) reaction could be eliminated at the interface between the electrode and MCA–BP active layer, where a redox reaction is commonly observed in BP-based resistive random-access memory (RRAM) by using Al electrodes followed the formation of the amorphous aluminum oxide layer (AlO x ) . For the memristor, the active layer is composed of the MCA supramolecules incorporating BP nanosheets (Figure c), while the TS selector could be achieved by inserting an additional pure MCA layer as a tunneling barrier (Figure d).…”
Section: Resultsmentioning
confidence: 99%
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“…Among the 2D family, 2D semiconductors with well-controlled Fermi levels, which are tunable by electrostatic fields, are promising candidates for next-generation nanoelectronics. For instance, 2D transition-metal dichalcogenides (TMDs) have exhibited various electronic applications with high performances due to their mature synthesis technologies, such as wafer-scale and quality controllable procedures. Currently, noble metal dichalcogenides (such as PtS 2 and PtSe 2 ), , few-layer black phosphorus (BP), and InSe have attracted intensive attention for nanoelectronics applications due to their desirable characteristics, including suitable band gap and high mobility. Additionally, BP has a widely tunable direct band gap that allows it to be an ideal material in optoelectronics. …”
Section: Introductionmentioning
confidence: 99%