Solution phase driven As₂S₃ chalcogenide films: Optical and picosecond nonlinear optical properties

Abstract

We demonstrate the fabrication and nonlinear optical (NLO) characterization of chalcogenide glass thin¯lms obtained from the solution phase driven approach. The characterization of thē lms was ahieved using FESEM, AFM, micro-Raman, FTIR, UV-Visible spectroscopy, optical pro¯lometry and XRD. The NLO studies were performed on the solution driven and thermally deposited As 2 S 3¯l ms with $2 ps, 800 nm laser pulses using the Z-scan technique. The results obtained from AFM measurements demonstrated that the surface roughness of the¯lm was considerably low ($2 nm) and Z-scan data indicated that the nonlinear refractive index was in the 1.0-11:0 Â 10 À18 m 2 /W range.