2010 Prognostics and System Health Management Conference 2010
DOI: 10.1109/phm.2010.5414595
|View full text |Cite
|
Sign up to set email alerts
|

Solution for improving manufacturing yield and reliability of package-on-package (PoP)

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2010
2010
2013
2013

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 15 publications
0
1
0
Order By: Relevance
“…Die embedded in the substrate which bonded to the underlying pad with golden wires; upper and lower substrates are interconnected by solder ball, after reflow soldering, the whole POP as a SOC was soldered to the printed circuit board [2,3,6]. However, traditional POP which adopted the bump interconnection with the solder balls may result in some issues, such as shifting, the bridging of adjacent solder balls, and the warpage of the substrate due to the different thermal stress which seriously influenced the practical application [4,5,7]. This paper proposes a novel stacking method to solve the problems of interconnection and stacking accuracy mentioned above.…”
Section: Introductionmentioning
confidence: 99%
“…Die embedded in the substrate which bonded to the underlying pad with golden wires; upper and lower substrates are interconnected by solder ball, after reflow soldering, the whole POP as a SOC was soldered to the printed circuit board [2,3,6]. However, traditional POP which adopted the bump interconnection with the solder balls may result in some issues, such as shifting, the bridging of adjacent solder balls, and the warpage of the substrate due to the different thermal stress which seriously influenced the practical application [4,5,7]. This paper proposes a novel stacking method to solve the problems of interconnection and stacking accuracy mentioned above.…”
Section: Introductionmentioning
confidence: 99%