2009
DOI: 10.1134/s1063782609070239
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Solid-state image converters on the basis of the GaAs/ZnS structures

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2009
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Cited by 4 publications
(6 citation statements)
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“…It can be noted that the influence of voltage sign during irradiating of GaAs by x-ray radiation with quanta energy range 40-140 keV is smaller as compared with data of the work [1]. It has been explained by the fact, that x-ray radiation is absorbed in all volume of the sample in the indicated energy range (Fig.…”
Section: Resultsmentioning
confidence: 54%
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“…It can be noted that the influence of voltage sign during irradiating of GaAs by x-ray radiation with quanta energy range 40-140 keV is smaller as compared with data of the work [1]. It has been explained by the fact, that x-ray radiation is absorbed in all volume of the sample in the indicated energy range (Fig.…”
Section: Resultsmentioning
confidence: 54%
“…As well as in the case of x-ray radiation influence with quanta energy 17 keV a photocurrent at negative voltage sign is more than at positive voltage sign irrespective of voltage on the detector. However observable effect of voltage polarity on the photocurrent is essentially less, than in [1].…”
Section: Resultsmentioning
confidence: 85%
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“…The GaAs:Cr/ZnS:Cu(Al) structures have been used in the design and fabrication of solid-state image converters operating under excitation of the structure by infrared and X-ray radiations with a brightness corresponding to the threshold values for black white (10-2 cd/m 2 ) and color (3 cd/m 2 ) images at doses in the range 0-12 R/s (Kalygina, et al, 2009). These structures can also be used for the development of ionizing radiation detectors with optical reading of information.…”
Section: Introductionmentioning
confidence: 99%