Particle Physics Reference Library 2020
DOI: 10.1007/978-3-030-35318-6_21
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Solid State Detectors for High Radiation Environments

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Cited by 4 publications
(4 citation statements)
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References 101 publications
(53 reference statements)
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“…where β is the proportionality factor (effective trapping damage constant) and τ eff,0 is the effective carrier lifetime before irradiation, which in standard silicon already after very moderate radiation levels can be neglected. Similar values for various silicon materials (FZ [57], DOFZ [57], MCz [58], and EPI [59]) and different heavy particle irradiations [6], [57] have been observed, resulting in β values of 4-6 × 10 −16 cm 2 /ns for electrons and 5-8 × 10 −16 cm 2 /ns for holes. In a more recent work focusing on high-fluence irradiations, deviations from the linear behavior shown in Fig.…”
Section: E Charge Carrier Trappingsupporting
confidence: 64%
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“…where β is the proportionality factor (effective trapping damage constant) and τ eff,0 is the effective carrier lifetime before irradiation, which in standard silicon already after very moderate radiation levels can be neglected. Similar values for various silicon materials (FZ [57], DOFZ [57], MCz [58], and EPI [59]) and different heavy particle irradiations [6], [57] have been observed, resulting in β values of 4-6 × 10 −16 cm 2 /ns for electrons and 5-8 × 10 −16 cm 2 /ns for holes. In a more recent work focusing on high-fluence irradiations, deviations from the linear behavior shown in Fig.…”
Section: E Charge Carrier Trappingsupporting
confidence: 64%
“…Recent review articles and books with relevance for displacement damage in silicon devices for HEP applications have been published by Kramberger [6], Leroy and Rancoita [7], Srour and Palko [8], and Hartmann [9].…”
Section: Introductionmentioning
confidence: 99%
“…where 𝑎, the prefactor, and 𝑏, the critical field, are the parameters that this study will determine, and 𝐸 is the electric field. The KDetSim package [11] was used to simulate the detector. The KDetSim package allows the user to define the doping profile of the sensor and uses this to calculate the electric field.…”
Section: Theorymentioning
confidence: 99%
“…However, an increase in the instantaneous luminosity is followed by an increase in radiation that leads to an increase in the leakage currents in the silicon material 9,10 . Furthermore, future Si-based particle detectors will feature several millions of tightly packed readout channels to meet detector requirements for proper sensing and signal conditioning.…”
Section: Introductionmentioning
confidence: 99%