1998
DOI: 10.1063/1.122159
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Solid phase epitaxial regrowth of ion beam-amorphized α-quartz

Abstract: Solid phase epitaxial growth of ion beam-amorphized α-quartz has been studied by means of Rutherford backscattering spectrometry in channeling geometry. α-quartz single crystals were irradiated with Cs+ and Xe+ ions and annealed in air or in vacuum at 500–900 °C. Complete epitaxial regrowth has been observed in the Cs-irradiated samples, after 875 °C annealing in air. On the other hand, vacuum annealing provided only incomplete regrowth of the amorphous layer, while Xe-irradiated α-quartz could not be regrown … Show more

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Cited by 46 publications
(51 citation statements)
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“…The basic mechanism of epitaxial regrowth of ionirradiated quartz has been discussed by Roccaforte et al [6][7][8] using ideas developed by Spaepen, Turnbull, and others [14][15][16][17]. It is noteworthy that, in all the cases with implanted alkali ions studied so far, the epitaxy of the amorphized layer, the out-diffusion of the alkali ions, and the oxygen exchange between the SiO 2 matrix and the annealing gas are highly correlated [4,6].…”
Section: Epitaxymentioning
confidence: 99%
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“…The basic mechanism of epitaxial regrowth of ionirradiated quartz has been discussed by Roccaforte et al [6][7][8] using ideas developed by Spaepen, Turnbull, and others [14][15][16][17]. It is noteworthy that, in all the cases with implanted alkali ions studied so far, the epitaxy of the amorphized layer, the out-diffusion of the alkali ions, and the oxygen exchange between the SiO 2 matrix and the annealing gas are highly correlated [4,6].…”
Section: Epitaxymentioning
confidence: 99%
“…It is noteworthy that, in all the cases with implanted alkali ions studied so far, the epitaxy of the amorphized layer, the out-diffusion of the alkali ions, and the oxygen exchange between the SiO 2 matrix and the annealing gas are highly correlated [4,6]. The most important reaction step consists in binding an implanted alkali ion A to the dangling oxygen ion, which is produced as radiation damage during the implantation of A (or any other ions) [4,6]. In the presence of migrating oxygen (O * ), this process can be described as…”
Section: Epitaxymentioning
confidence: 99%
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“…For the various ions, epitaxy starts only above critical temperatures and ion fluences. These results were obtained by ion-beam analyses, such as Rutherford backscattering (channeling) spectrometry (RBS, RBS-C) and elastic recoil detection analysis (ERDA) [3][4][5][6], and were explained with the help of the concept of the SiO 2 network topology [7,8].…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, we have investigated the processes and mechanisms of solid phase epitaxial regrowth (SPEG) in alkali-ion implanted a-quartz during thermal annealing in oxygen and air [3][4][5][6]. The dependence of SPEG on appropriately selected ion species (Li, Na, Rb, Cs), their fluences and annealing conditions (such as type of annealing gas, annealing time and temperature) have been studied.…”
Section: Introductionmentioning
confidence: 99%