2017
DOI: 10.6117/kmeps.2017.24.1.083
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Solderability of thin ENEPIG plating Layer for Fine Pitch Package application

Abstract: In this paper, we evaluated the solderability of thin electroless nickel-electroless palladium-immersion gold (ENEPIG) plating layer for fine-pitch package applications. Firstly, the wetting behavior, interfacial reactions, and mechanical reliability of a Sn-3.0Ag-0.5Cu (SAC305) solder alloy on a thin ENEPIG coated substrate were evaluated. In the wetting test, maximum wetting force increased with increasing immersion time, and the wetting force remained a constant value after 5 s immersion time. In the initia… Show more

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Cited by 9 publications
(5 citation statements)
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“…(11) The PVP solution was prepared by mixing PVP powder (Sigma-Aldrich, Mw~20,000) with propylene glycol monomethyl ether acetate (PGMEA, Sigma-Aldrich), and cross-linking agent (CLA) was added to the PVP solution with a ratio of 3:1 to improve the dielectric property. (12) The solution was stirred using a magnetic spin-bar for 24 hours. The spin coated PVP films were thermally cross-linked by two step annealing process.…”
Section: Methodsmentioning
confidence: 99%
“…(11) The PVP solution was prepared by mixing PVP powder (Sigma-Aldrich, Mw~20,000) with propylene glycol monomethyl ether acetate (PGMEA, Sigma-Aldrich), and cross-linking agent (CLA) was added to the PVP solution with a ratio of 3:1 to improve the dielectric property. (12) The solution was stirred using a magnetic spin-bar for 24 hours. The spin coated PVP films were thermally cross-linked by two step annealing process.…”
Section: Methodsmentioning
confidence: 99%
“…Since both the probe and MLC are Ni/Au plated, Ni 3 Sn and AuSn2 are formed following the interface regardless of the solder composition. Additionally, (Cu, Ni, Au) 6 Sn 5 and Cu 6 Sn 5 IMC were formed inside the solder, while Ag 3 Sn was formed when T7 SAC305 was used [13][14][15] . Fig.…”
Section: Analysis Of Joint Cross-section and Fracture Surfacementioning
confidence: 99%
“…It can be seen that fillets were well formed in the probe solder joints, and various types of intermetallic compounds (IMC) were formed on the interface of probe solder joints. Regardless of the type, in the Pb-free solder joint of SAC305 and SAC0307, Ni IMCs were formed on the interface of probe solder joint, and on the solder base metal, Ag 3 Sn, Au x Sn y , Cu 6 Sn 5 , and (Cu,Ni,Au) 6 Sn 5 IMCs were formed [7][8][9][10][11][12][13][14][15] . Since the surface of the probe is plated with Ni/Au, various types of Au-Sn IMCs were observed inside the solder joint.…”
Section: Cross-sectional Analysis Of As-soldered Probe-mlc Jointmentioning
confidence: 99%