2020
DOI: 10.1002/jctb.6564
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Solar light‐induced photocatalytic degradation of methylparaben by g‐C3N4 in different water matrices

Abstract: BACKGROUND: In this study, graphitic carbon nitride (g-C 3 N 4) photocatalyst was successfully synthesized via calcination of urea under argon flow and tested for methyl paraben (MeP) degradation in aqueous media under simulated solar light for the first time. Its structural, morphological, and optical properties were investigated with the use of X-Ray diffraction (XRD), diffuse reflectance spectroscopy (DRS), and Brunauer-Emmett-Teller (BET) surface area analysis method. RESULTS: The as-synthesized g-C 3 N 4 … Show more

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Cited by 14 publications
(2 citation statements)
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“…The diffraction signal at 2q = 27.4°is ascribed to the (0 0 2) plane of graphitic carbon nitrides and related to the van der Waals forces that generate the periodic stacking between layers along the c axis. [11][12][13] In comparison to the bulk-U sample the exfoliated samples showed a decrease in the intensity of both peaks, more signicant for the diffraction at 27.4°. The enlarged view of the (0 0 2) peak (Fig.…”
Section: Characterization Of the Photocatalystsmentioning
confidence: 88%
“…The diffraction signal at 2q = 27.4°is ascribed to the (0 0 2) plane of graphitic carbon nitrides and related to the van der Waals forces that generate the periodic stacking between layers along the c axis. [11][12][13] In comparison to the bulk-U sample the exfoliated samples showed a decrease in the intensity of both peaks, more signicant for the diffraction at 27.4°. The enlarged view of the (0 0 2) peak (Fig.…”
Section: Characterization Of the Photocatalystsmentioning
confidence: 88%
“…The specific surface area (SSA) of biochar was determined with the use of a micromeritics (Gemini III 2375) instrument (Norcross, GA, USA), while XRD patterns were obtained with the use of a Brucker D8 Advance instrument with a Cu Kα source (λ = 1.5496 Å). More details about the aforementioned characterization techniques can be found in former studies of our group [40,41]. SEM images were recorded on a JEOL JSM 6300 instrument (JEOL, Akishima, Tokyo, Japan), equipped with an X-ray energy dispersive spectrometer, EDS (ISIS Link 300, Oxford Instruments, High Wycombe, UK).…”
Section: Physicochemical Characterization Techniquesmentioning
confidence: 99%