Conference Record of the Twentieth IEEE Photovoltaic Specialists Conference 1988
DOI: 10.1109/pvsc.1988.105990
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Solar cells made from p-CdTe films grown with ion-assisted doping

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“…Successive etching and C-V measurement was found to be a useful method to obtain a complete hole density profile in p-CdTe:P. This method was later used by Sharps et aL [30] in order to construct the hole density profiles in ion-doped p-CdTe:P epitaxial layers grown with varying ion doses.…”
Section: Cdcd = Cd(g) + Vcdmentioning
confidence: 99%
“…Successive etching and C-V measurement was found to be a useful method to obtain a complete hole density profile in p-CdTe:P. This method was later used by Sharps et aL [30] in order to construct the hole density profiles in ion-doped p-CdTe:P epitaxial layers grown with varying ion doses.…”
Section: Cdcd = Cd(g) + Vcdmentioning
confidence: 99%