2019 IEEE Latin American Test Symposium (LATS) 2019
DOI: 10.1109/latw.2019.8704595
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Software-Based Mitigation for Memory Address Decoder Aging

Abstract: Integrated circuits typically contain design margins to compensate for aging. As aging impact increases with technology scaling, bigger margins are necessary to achieve the desired reliability. However, these increased margins lead to a reduced performance and lower yield. Alternatively, mitigation schemes can be deployed to reduce the aging. This paper proposes a software-based method to mitigate the aging of the memory's address decoder logic due to Bias Temperature Instability. The method is based on period… Show more

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Cited by 3 publications
(5 citation statements)
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References 19 publications
(26 reference statements)
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“…Furthermore, depending on the given workload, some paths have higher delay increase due to aging than others. As in [17], we aim to mitigate aging by changing the workload that affects the memory. This change is done by executing an dedicated small auxiliary workload periodically.…”
Section: Proposed Mitigation Methodologymentioning
confidence: 99%
See 4 more Smart Citations
“…Furthermore, depending on the given workload, some paths have higher delay increase due to aging than others. As in [17], we aim to mitigate aging by changing the workload that affects the memory. This change is done by executing an dedicated small auxiliary workload periodically.…”
Section: Proposed Mitigation Methodologymentioning
confidence: 99%
“…In this study, we rely on the accurate combined model for Negative BTI in PMOS and Positive BTI in NMOS transistors proposed in [19] for the 28 nm technology and calibrated for 22 nm Predictive Technology Model (PTM) technology as explained in [17]. The resulting dependency of the BTI-induced threshold voltage (Vth) shift depending on the average duty factor (the probability of a transistor to be on) for NMOS and PMOS is presented in Fig.…”
Section: A Bias Temperature Instability Modelmentioning
confidence: 99%
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