Soft X-ray spectromicroscopy and ptychography

Hitchcock, Adam P.

doi:10.1016/j.elspec.2015.05.013

Cited by 104 publications

(87 citation statements)

References 77 publications

(103 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Analyzable elements with a K‐edge or L‐edge within the soft X‐ray roughly span from Be to Zr. Spectromicroscopy provides imaging capabilities with high spectral resolution and may be combined with microspectroscopic techniques, such as X‐ray absorption spectroscopy (XAS)—both through transmission and energy‐resolved X‐ray fluorescence (XRF) detection—and X‐ray photoelectron spectroscopy (XPS) (Hitchcock et al, 2010; Pushie et al, 2014; Hitchcock, 2015). The main types of synchrotron radiation‐based soft X‐ray spectromicroscopy include scanning transmission X‐ray microscopy (STXM), transmission X‐ray microscopy (TXM), X‐ray photoemission electron microscopy (X‐PEEM), and scanning photoelectron microscopy (SPEM) (Fig.…”

Section: Soft X‐ray Spectromicroscopymentioning

confidence: 99%

“…1). All four spectromicroscopic techniques may be combined with near‐edge X‐ray absorption fine structure (NEXAFS), and X‐PEEM and SPEM may be coupled with XPS with the addition of an electron dispersive analyzer (Hitchcock, 2015). Low‐energy XRF is available on select STXM and TXM beamlines, which offers improved detection over transmission mode (Gianoncelli et al, 2009; Kaulich et al, 2009; Hitchcock et al, 2010 2012).…”

Section: Soft X‐ray Spectromicroscopymentioning

confidence: 99%

“…Basic configurations for the four major soft X‐ray spectromicroscopic techniques: scanning transmission X‐ray microscopy (STXM), scanning photoelectron microscopy (SPEM), transmission X‐ray microscopy (TXM), and X‐ray photoemission electron microscopy (XPEEM). Reprinted from Hitchcock (2015), with permission from Elsevier.…”

Section: Soft X‐ray Spectromicroscopymentioning

confidence: 99%

“…In STXM, monochromatic X‐rays are passed through a zone plate focusing lens onto a spot on the sample, which is scanned in the focal plane of the zone plate (Fig. 1) (Kaulich et al, 2011; Hitchcock, 2015). X‐ray absorption is measured as a function of sample position by detecting transmitted X‐rays.…”

Section: Soft X‐ray Spectromicroscopymentioning

confidence: 99%

See 3 more Smart Citations

Advances in Scanning Transmission X‐Ray Microscopy for Elucidating Soil Biogeochemical Processes at the Submicron Scale

et al. 2017

View full text Add to dashboard Cite

Organic matter, minerals, and microorganisms are spatially associated in complex organo-mineral assemblages within soils. A mechanistic understanding of processes occurring within organo-mineral assemblages requires noninvasive techniques that minimize any disturbance to the physical and chemical integrity of the sample. Synchrotron-based soft (50-2200 eV) X-ray spectromicroscopic techniques, including scanning transmission X-ray microscopy (STXM), transmission X-ray microscopy (TXM), X-ray photoemission electron microscopy (X-PEEM), and scanning photoelectron microscopy (SPEM), coupled with microspectroscopy (e.g., near-edge X-ray absorption fine structure; NEXAFS) allow for determining the spatial association and speciation of most elements found in soils while maintaining sample integrity. This review highlights application of the four spectromicroscopic techniques mentioned above to soil biogeochemical research, with particular emphasis on STXM-NEXAFS, which has contributed to the greatest set of advancements in the understanding of soil organo-mineral interactions, including mineral control on organic carbon cycling and the mechanisms of biomineral formation.

show abstract

Section: Soft X‐ray Spectromicroscopymentioning

confidence: 99%

Section: Soft X‐ray Spectromicroscopymentioning

confidence: 99%

Section: Soft X‐ray Spectromicroscopymentioning

confidence: 99%

Section: Soft X‐ray Spectromicroscopymentioning

confidence: 99%

See 2 more Smart Citations

Advances in Scanning Transmission X‐Ray Microscopy for Elucidating Soil Biogeochemical Processes at the Submicron Scale

et al. 2017

View full text Add to dashboard Cite

show abstract

“…

…”

mentioning

confidence: 99%

Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials

Wang

Hou

et al. 2018

Microsc Microanal

View full text Add to dashboard Cite

Scanning transmission X-ray microscopy (STXM) employs a nano-sized X-ray beam and provides spectro-microscopic information by measuring the absolute absorption of the specimen in transmission; thus both chemical images and detailed absorption spectroscopic features of a single nanostructure (including its thickness) can be revealed [1]. STXM-Ptychography reaches a spatial resolution of 10 nm in the hard X-ray and below 5 nm in the soft X-ray [2,3]. Recently STXM using X-ray fluorescence yield (FY) and total electron yield (TEY) mode has been developed to visualize local element segregation, chemistry and conductivity variation among different crystal facets of LiNi1/3Fe1/3Mn4/3O4 micro-sized particles at the transition metal L-edges and O K-edge, which do not suffer from the sample thickness limitation because soft X-ray cannot penetrate thick samples [4]. Jacobsen et. al. have demonstrated that scanning luminescence X-ray microscopy (SLXM) can be used to form high-resolution images of ZnS based phosphor P31 microparticles and polystyrene microspheres loaded with fluorescent dye based on the visible light emission from the sample and the fluorescent dye, respectively [5]. More recently, Vaz et. al. demonstrated imaging of the magnetic domain configuration of cobalt microstructures fabricated on MgO(001) using the photoluminescence from the MgO substrate in STXM [6]. These encourage further development of STXM with the capability of photoluminescence yield (PLY) mode for studying luminescent nanomaterials. Here we demonstrate the imaging of individual Eu doped Y2O3 submicrospheres using STXM based on the optical luminescence from the sub-microspheres. Furthermore, PLY-X-ray absorption near edge structures (PLY-XANES) can be isolated from individual submicrospheres.Eu-doped Y2O3 submicrospheres were prepared by homogeneous precipitation and post-annealing with CO(NH2)2, Y(NO3)3 and Eu(NO3)3 as starting materials. STXM measurement was carried out at the SM beamline of the Canadian Light Source (CLS). A 25 nm outermost-zone zone plate (CXRO, Berkeley Lab) is used and the diffraction-limited spatial resolution for this zone plate is 30 nm. As shown in Figure 1, the detector was modified to only collect the optical luminescence emitted from the sample. More details of STXM measurement and data analysis can be found elsewhere [7]. Figure 2a shows a STXM image of Eu doped Y2O3 submicrospheres that monitored the optical luminescence emitted from the submicrospheres when excited at 540 eV. The morphology of the sample is well resolved, showing spherical shape with diameter of about 250-500 nm. The luminescence intensity is much stronger at the center than the edge area of single submicrospheres (e.g.: as marked by green dashed circle), suggesting that the sample is solid, not a hollow structure. The STXM image is consistent

show abstract

Recent Developments in Soft X ‐Ray Absorption Spectroscopy

Moewes

2017

Handbook of Solid State Chemistry

View full text Add to dashboard Cite

X ‐ray absorption spectroscopy ( XAS ) is one of the oldest and most widely employed spectroscopy techniques today. The principles emerged shortly after Röntgen's discovery of X ‐rays in 1895 (Sagnac, G. (1901) Ann. Chim. Phys ., 23 , 145–198; Stumm von Bordwehr, R. (1989) Ann. Phys. Fr ., 14 , 377–466), while the discovery and naming of the K‐ and L‐lines occurred in 1911 (Stumm von Bordwehr (1989); Inokuti, M. and Noguchi, T. (1974) Am. J. Phys ., 42 , 1118–1119). The first tunable synchrotron light source was built in the 1940s, and while their use in the study of materials dates back to roughly 50 years ago, it was only in the 1980s that soft X ‐ray absorption spectroscopy rose to its current popularity. Today, XAS is routinely applied at all synchrotron sources to solve scientific problems in physics, chemistry, material sciences, life sciences, geology, medicine, and engineering. The technique is powerful because it is element specific, nondestructive, and highly sensitive to the local bonding environment and geometric structure surrounding the absorbing atom as well as to spin, orbital angular momenta, and the polarization of the exciting radiation.

show abstract

Soft X-ray spectromicroscopy and ptychography

Cited by 104 publications

References 77 publications

Advances in Scanning Transmission X‐Ray Microscopy for Elucidating Soil Biogeochemical Processes at the Submicron Scale

Advances in Scanning Transmission X‐Ray Microscopy for Elucidating Soil Biogeochemical Processes at the Submicron Scale

Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials

Recent Developments in Soft X ‐Ray Absorption Spectroscopy

Contact Info

Product

Resources

About