Soft X-Ray Resonant Magnetic Scattering from a Magnetically Coupled Ag/Ni Multilayer

Abstract

X-ray resonant magnetic scattering experiments using linear and circular polarized light were performed at the Ni Lz3 absorption edges on a Ag/Ni multilayer.A superlattice magnetic peak, due to the antiferromagnetic coupling between Ni layers, is evidenced. In the case of a ferromagnetic coupling, large changes in the charge peak (up to 15%) are observed upon reversal of the direction of the magnetic field. The magnetic scattering amplitude is evaluated to SI. O per nickel atom. Sum rules have been applied for the first time to the energy-dependent magnetic amplitude.

Antiferromagnetic dipolar ordering in[Co2MnGe∕V]Nmultilayers

“…X-ray resonant magnetic scattering (XRMS) allows for the determination of elementspecific chemical and magnetic depth profiles of layered structures [172,173,174]. These profiles can be obtained by a quantitative analysis of specular reflectivity measurements, usually performed by numerical simulation.…”

Soft x-ray resonant magneto-optical Kerr effect as a depth-sensitive probe of magnetic heterogeneity: Its application to resolve helical spin structures using linear p polarization

“…These MO properties are very useful to determine the depth-varying spin structures by fitting the measured specular I K versus to those calculated from the various model configurations, as used in x-ray/neutron scattering experiments and analysis of the structural refinements. [19][20][21] The specular Kerr intensity reflected from a magnetized film in the vicinity of the resonance thresholds is a kind of an x-ray resonant magnetic scattering. As reported in Ref.…”

“…[13][14][15][16][17][18] Specifically, the K and K spectra, as a function of the grazing angle of incidence for different photon energies h s near the resonance regions, provide invaluable information on magnetic heterostrutures, such as depth-varying spin directions, so that these spectra are very informative to determine the depth-dependent spin structure inherently present in the magnetic multilayer films that consist of several ultrathin layers of different elements. While neutron scattering, 19 and resonant specular 20 and off-specular 21 reflectivity have been a tool to study the magnetic heterogeneity in the films imposed by chemical inhomogeneity.…”

Proximity effects on dimensionality and magnetic ordering in Pd/Fe/Pd trialyers

“…The element specific measurements of the magnetization were obtained using resonant magnetic scattering (XRMS) which has a high reciprocal space resolution allowing for depth resolved studies through an appropriate choice of energy and scattering configuration 15 . The experiments were performed on beamlines X13A 16 at the National Synchrotron Light Source, XMaS at the European Synchrotron Radiation Facility 17 and 4-ID-D at the Advanced Photon Source 18 .…”