Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light

Schäfers, F.; Mertins, Hans Christoph; Gaupp, A.; Gudat, W.; Mertin, M.; Packe, Ingo; Schmolla, Frank; Fonzo, S. Di; Soullié, G.; Jark, W.; Walker, R.P.; Cann, X. Le; Nyholm, R.; Eriksson, Mikael

doi:10.1364/ao.38.004074

Cited by 219 publications

(133 citation statements)

References 40 publications

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“…Therefore, a complete polarization analysis is usually performed at synchrotrons with sophisticated polarimetric and ellipsometric instruments. [9][10][11] In a small-scale laboratory, various EUV and soft X-ray light sources are available, but only few of them are a priori polarized. While linearly polarized EUV light is routinely generated by intense ultrashort laser pulses, 12 only few attempts to either polarize EUV radiation circularly 13,14 or directly generate circular EUV radiation from a femtosecond laser 15 have been reported from laboratory-based experiments.…”

Section: Introductionmentioning

confidence: 99%

Generation of circularly polarized radiation from a compact plasma-based extreme ultraviolet light source for tabletop X-ray magnetic circular dichroism studies

Wilson

Rudolf

Weier

et al. 2014

Review of Scientific Instruments

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Generation of circularly polarized light in the extreme ultraviolet (EUV) spectral region (about 25 eV–250 eV) is highly desirable for applications in spectroscopy and microscopy but very challenging to achieve in a small-scale laboratory. We present a compact apparatus for generation of linearly and circularly polarized EUV radiation from a gas-discharge plasma light source between 50 eV and 70 eV photon energy. In this spectral range, the 3p absorption edges of Fe (54 eV), Co (60 eV), and Ni (67 eV) offer a high magnetic contrast often employed for magneto-optical and electron spectroscopy as well as for magnetic imaging. We simulated and designed an instrument for generation of linearly and circularly polarized EUV radiation and performed polarimetric measurements of the degree of linear and circular polarization. Furthermore, we demonstrate first measurements of the X-ray magnetic circular dichroism at the Co 3p absorption edge with a plasma-based EUV light source. Our approach opens the door for laboratory-based, element-selective spectroscopy of magnetic materials and spectro-microscopy of ferromagnetic domains

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Section: Introductionmentioning

confidence: 99%

Generation of circularly polarized radiation from a compact plasma-based extreme ultraviolet light source for tabletop X-ray magnetic circular dichroism studies

Wilson

Rudolf

Weier

et al. 2014

Review of Scientific Instruments

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“…A periodic multilayer working at the quasi-Brewster angle provides a high degree of polarization, and a phase shift between the sand p-polarized light can be introduced when the multilayer Bragg peak is designed near 45 for both reflection and transmission geometries. [40][41][42] Therefore, multilayers are commonly used as a polarizer or phase retarder in the XUV region. [43][44][45][46][47] To extend the working bandwidth of polarizers in applications, the aperiodic multilayer system can be used as an alternative for the double-polarizer scheme 48 or the laterally graded multilayer.…”

Section: Broadband Multilayer Polarizermentioning

confidence: 99%

Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics

Huang

Медведев

Kruijs

et al. 2017

Applied Physics Reviews

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Extreme ultraviolet and soft X-ray (XUV) multilayer optics have experienced significant development over the past few years, particularly on controlling the spectral characteristics of light for advanced applications like EUV photolithography, space observation, and accelerator- or lab-based XUV experiments. Both planar and three dimensional multilayer structures have been developed to tailor the spectral response in a wide wavelength range. For the planar multilayer optics, different layered schemes are explored. Stacks of periodic multilayers and capping layers are demonstrated to achieve multi-channel reflection or suppression of the reflective properties. Aperiodic multilayer structures enable broadband reflection both in angles and wavelengths, with the possibility of polarization control. The broad wavelength band multilayer is also used to shape attosecond pulses for the study of ultrafast phenomena. Narrowband multilayer monochromators are delivered to bridge the resolution gap between crystals and regular multilayers. High spectral purity multilayers with innovated anti-reflection structures are shown to select spectrally clean XUV radiation from broadband X-ray sources, especially the plasma sources for EUV lithography. Significant progress is also made in the three dimensional multilayer optics, i.e., combining micro- and nanostructures with multilayers, in order to provide new freedom to tune the spectral response. Several kinds of multilayer gratings, including multilayer coated gratings, sliced multilayer gratings, and lamellar multilayer gratings are being pursued for high resolution and high efficiency XUV spectrometers/monochromators, with their advantages and disadvantages, respectively. Multilayer diffraction optics are also developed for spectral purity enhancement. New structures like gratings, zone plates, and pyramids that obtain full suppression of the unwanted radiation and high XUV reflectance are reviewed. Based on the present achievement of the spectral tailoring multilayer optics, the remaining challenges and opportunities for future researches are discussed.

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“…This linear polarizer can thus be also used as an analyzer to determine the degree of a linear polarization P L in the soft x-ray region. [14][15][16][17] In this letter, we report on a theoretical design of an efficient soft x-ray polarizer that enables to optically convert a linear polarization to any orthogonal states of not only the L-and R-circular polarizations but also the linear s-and p-polarizations in reflection, using a simple thin-film structure. Numerical calculations reveal that the orthogonal eigenstates of the linear and circular polarization modes of waves reflected from such a polarizer can be produced with the degree of polarizations greater than 0.95 in a certain energy range just below the absorption edges, and are switchable rapidly by reversing the orientation of longitudinal magnetizations, M long .…”

Section: Soft X-ray Polarizer For Optical Productions Of Any Orthogonmentioning

confidence: 99%

Soft x-ray polarizer for optical productions of any orthogonal state of the linear and circular polarization modes

Jeong

Lee

Kim

2006

Applied Physics Letters

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An efficient soft x-ray polarizer that is able to optically convert a linear polarization state to any orthogonal state of not only linear but also circular polarization modes is found by means of numerical calculations of the intensities of individual orthogonal polarization components in reflected waves. Calculation results, using the known linear-polarization-mode based Kerr matrix as well as a newly derived circular-polarization-mode based Kerr matrix, indicate that a +45° or −45° linearly polarized incident wave can be readily converted to any orthogonal states of both circular and linear polarization modes, i.e., left- and right-handed circular and s- and p-linear polarizations through reflection, at certain grazing angles of incidence near the critical angle from a simple ferromagnetic thin film of Co(9.0nm)∕Si substrate. The intensities of almost pure circularly or linearly polarized reflected waves are about 10% or less in a certain spectral soft x-ray range just below the absorption edges of constituent magnetic elements. The counterpart orthogonal states of the linear as well as circular modes can be rapidly switched simply by reversing oppositely the orientation of longitudinal magnetizations. These results suggest that the orthogonal polarization states of the circular- and linear-polarization modes converted from such a polarizing optical element through reflection can be practically used in probing the vector quantities of element specific magnetizations in multicomponent magnetic materials.

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Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light

Cited by 219 publications

References 40 publications

Generation of circularly polarized radiation from a compact plasma-based extreme ultraviolet light source for tabletop X-ray magnetic circular dichroism studies

Generation of circularly polarized radiation from a compact plasma-based extreme ultraviolet light source for tabletop X-ray magnetic circular dichroism studies

Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics

Soft x-ray polarizer for optical productions of any orthogonal state of the linear and circular polarization modes

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