2003
DOI: 10.1080/08940880308603017
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Soft X‐ray Microcopy at the ALS

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Cited by 5 publications
(2 citation statements)
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“…In 1993, the Advanced Light Source (ALS) in the US started operation as the world's first third-generation synchrotron light source facility. The characteristic of the third-generation light source is its small beam size with small divergence (i.e., low emittance), and therefore, combining conventional measurement techniques microscopy with was started [56]. One technique enables microscopic imaging by narrowing the beam size with optical elements, and this technique has a scanning mode and an imaging mode.…”
Section: E Development Of Techniques Combined With Microscopymentioning
confidence: 99%
“…In 1993, the Advanced Light Source (ALS) in the US started operation as the world's first third-generation synchrotron light source facility. The characteristic of the third-generation light source is its small beam size with small divergence (i.e., low emittance), and therefore, combining conventional measurement techniques microscopy with was started [56]. One technique enables microscopic imaging by narrowing the beam size with optical elements, and this technique has a scanning mode and an imaging mode.…”
Section: E Development Of Techniques Combined With Microscopymentioning
confidence: 99%
“…Full-field x-ray microscopy has made great progress in recent years [1,2,3]; and a spatial resolution of 15nm has been reported [4]. Commercial x-ray microscopes using synchrotron sources and laboratory x-ray sources are already available [5].…”
Section: Introductionmentioning
confidence: 99%