Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics

Abstract

The high transparency of carbon-containing materials in the spectral region of "carbon window" (lambda approximately 4.5-5nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of Nd-glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targets.

Short-Period Multilayer X-ray Mirrors for “Water” and “Carbon Windows” Wavelengths

“…This sort of high spatial resolution optical systems based on normal-incidence XMMs is rather popular in various soft X-ray imaging and focusing experiments. 1,2,[48][49][50][51][52] This deposition work required special efforts to get the mirrors' reflectivity bands overlapped (see below). Figure 16.…”

“…X-ray multilayer mirrors (XMMs) are known to be one of the most popular X-ray optical elements that have been used in a lot of imaging and focusing X-ray experiments. 1,2 The obvious advantages of XMMs, such as large clear aperture, near-normal incidence operation mode, spectral selectivity and mechanical and thermal stability make them to be the best choice in many X-ray optical applications based on a compact X-ray source. * Author to whom correspondence should be addressed.…”

Transition wavelengths and unresolved transition array statistics of ions withZ= 72–89

“…Recent experiments have employed the LPP technique using metal targets to generate EUV/SXR radiation. For example, a bulk rhenium target was used to develop new SXR microscopy applications in the 'carbon window' (λ ≈ 4.5-5 nm) [35]. Also a solid gold-based LPP source was utilized in the design of an EUV source and optics setup to achieve high energy density and spatial resolution in a compact setup [36].…”

Structural and magnetic phenomena in ultrathin C/Co/C stacks prepared by DC magnetron sputtering

“…The carbon layer thickness 5 nm is enough to protect the Co layer from the substrate and the ambient air influence 17. In addition, a three‐layer stack is a model unit for the Co/C multilayer system that has been developed for the reflective coating in X‐ray microscopy of a “carbon window” ( λ ∼ 4.5 nm) 2, 18.…”