2019
DOI: 10.1049/iet-cdt.2018.5015
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Soft‐error reliable architecture for future microprocessors

Abstract: The transient error is the failure of the device due to transient hardware faults caused by high-energy particles like neutron and alpha particle strikes. In this study, the authors propose two schemes of fault-tolerant architecture. The first scheme is a hardware-based solution called REMO that combines the best features of space and time redundancy. REMO provides very high fault coverage with minimum overheads in performance, power and area. The second scheme, REMORA combines the best features of hardware an… Show more

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References 38 publications
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