2001
DOI: 10.1021/cr9900376
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Small-Angle X-ray Scattering of Polymers

Abstract: Benjamin Chu obtained his B.S. degree, magna cum laude, from St. Norbert College and his Ph.D. degree in Physical Chemistry from Cornell University. He was a postdoctoral student with the late Professor Peter J. W. Debye for four years before he started his academic career at the University of Kansas. In 1968, he moved to the State University of New York at Stony Brook, where he is now a Distinguished Professor.

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Cited by 365 publications
(287 citation statements)
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“…This is usually based on small angle x-ray scattering data, which however do not provide a real image of the structure [15]. A closed theory about the development of the various morphologies is not available.…”
Section: Introductionmentioning
confidence: 99%
“…This is usually based on small angle x-ray scattering data, which however do not provide a real image of the structure [15]. A closed theory about the development of the various morphologies is not available.…”
Section: Introductionmentioning
confidence: 99%
“…[44][45][46] More details related to various aspects of SAXS analysis of polymers are covered in these review articles. 47,48 The morphologies of the pristine SPEEK and SPEEK composite membranes are reflected by the combined SAXS data, which are shown in Figure 2. The desmeared data are plotted on an absolute scale, i.e., the differential scattering cross section d per unit solid angle d , per unit sample volume …”
Section: Resultsmentioning
confidence: 99%
“…SAXS experiments were carried out at the beamline X27C of the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory (BNL). In order to obtain high-quality SAXS patterns for the delicate quantitative analysis, a three pinhole collimation system was used to reduce the beam divergence (Chu & Hsiao, 2001) and a vacuum sample chamber was introduced to lower the background scattering from air and Kapton windows. In order to ensure the absence of systematic errors introduced by the detection system, two different types of detector technology (imaging plates and charge-coupled device) with different counting and readout mechanisms were used to record the scattering pattern from the same sampling volume, showing an excellent agreement.…”
Section: Experimental and Data Analysismentioning
confidence: 99%