Sm-Doped NiFe Thin Films: Structural and Magnetic Characterization

Abstract

This paper reports on the effect of Sm doping concentration on structural and static magnetic properties of electrodeposited NiFe thin films. A reduction of Ni concentration from 80 to 50 percent was observed as the Sm concentration increased from 0 to 25%. XRD analyses revealed that a transition from crystalline to partially disordered state occurred on the Sm-doped NiFe thin films and ultimately transformed to amorphous state at higher concentration. The saturation magnetization decreased to ~50% at 25% Sm doping as compared to that of NiFe thin films.