Slow highly charged ion induced nanopit formation on the KCl(001) surface

Abstract

We report on nanostructuring of the KCl(001) surface induced by the individual impact of slow highly charged ions. Samples were irradiated with Xe ions with charge states of Q = 15 to 40 at kinetic energies from 1.7 to 160 keV. The formation of nanopits at the virgin surface is observed and attributed to a defect-mediated desorption process involving the removal of up to 2000 surface atoms per incident ion. The depth of the produced pits is shallow, but not limited to the first monolayer. From the variation of the ion parameters (charge state and kinetic energy) we derive a phase diagram for the structuring of the KCl(001) surface with highly charged ions.

Desorption Yields and Irradiation-Condition Dependence of Layer-by-Layer Removal for KBr(001) Surface Stimulated by Electrons

“…Expanding our measurements, with respect to the total desorption yields and extension in the curve, into a wider energy region is desirable, which could also be a clue for determining the energy dependence of the desorption yields. The energy-dependent results may be useful for studying recent new topics on ESD by HCIs, where an ion above or within the surface acts not only as a point source for potential sputtering, but also as a source for energetic electrons via Auger processes 8,9) .…”

“…The available reports explain only a few measurements of sample temperature or electron beam energy. In this study, we present the measured emission yields and expect that the results will be useful for studying the effects of ESD on DIET process by highly charged ions (HCIs) 8,9) . On the basis of our experimental data, we attempt to clarify some points ; for instance, the oscillatory behavior of the specular yields depends on the conditions of electron irradiation, such as electron energy (Ee), electron current density (ie), and sample temperature (T).…”

Neutralization Dynamics of Slow Highly Charged Ions in 2D Materials

“…(Color online) (a) Atomic force microscopy image of a KCl(001) surface irradiated with 70 keV Xe 35+ ions. One-to two-monolayer-deep pits resulting from single ion impacts can be observed [33,39]. (b) AFM image of a LiF(001) surface irradiated with 99 keV Xe 20+ ions.…”