K 71 phys. stat. sol. (a)% K71 (1983)Regarding the measurements and interpretation of transverse magnetoresistance specific problems /1 to 3/ arise from ambipolar conductivity, scattering mechanism, inhomogeneities, and shape influence of the semiconductor, which have been thoroughly discussed in a recent paper /4/ for p-type InSb with real surfaces. Geometry effects via specimen thickness and inhomogeneities via internal barriers have been discriminated by investigation of the thickness, field, and temperature dependence of the magnetoresistance. In this note, we present new data on n-type InSb with real surfaces, which give us greater insight into the contributing effects. 1 7 prepared from InSb single crystals grown in [211] direction with a Bridgman technique (M.C. P. Electronics Ltd., Alperton, Wembley (Middlesex)). Further details, including surface treatments, fabrication of current contacts and potential probes, sample dimensions and mounting, have been given elsewhere The specimens (excess electron concentration 5 x 1 0~~ to 10 ~m '~) a r e /4, 5/.Measurements of galvanomagnetic properties have been performed by suitable dc techniques with a standard five-probe circuit /4/ as a function of temperature T, magnetic induction By thickness t, and barrier height Vs without breaking the vestigated to obtain the charge carrier cparacteristics. Ac field effect measurements were imployed with a conventional bending at the surface. Details of the experimental set-up and of the electronic equipment for the single measurements have been reported /4, 6/.Pa vacuum. The Hall coefficient % mainly was incircuit /6/ to determine the band The principal features (Fig. 1 and 2) of all the measured crystals qualitatively are similar within the range of carrier concentrations investigated. Repeated measurements over several runs yielded reproducible results within 1) Schlossgartenstr. 7, D-6100 Darmstadt, FFG.