1997
DOI: 10.7209/tanso.1997.235
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Size Effect inthe In-plane Electrical Resistivity of Very Thin Graphite Crystals

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Cited by 35 publications
(33 citation statements)
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“…Between 1997 and 2000, Ohashi et al succeeded in cleaving crystals down to approximately 20 nm in thickness, studied their electrical properties including Shubnikov-de Haas oscillations, and, quite remarkably, observed the electric field effect with resistivity changes of up to 8 %. [62,63] Also, Ebbesens group succeeded in the growth of micron-sized graphitic disks with thickness down to 60 layers and measured their electrical properties. [64] As for theory, let me make only a short note (for more references, see Refs.…”
Section: Graphene Incarnationsmentioning
confidence: 99%
“…Between 1997 and 2000, Ohashi et al succeeded in cleaving crystals down to approximately 20 nm in thickness, studied their electrical properties including Shubnikov-de Haas oscillations, and, quite remarkably, observed the electric field effect with resistivity changes of up to 8 %. [62,63] Also, Ebbesens group succeeded in the growth of micron-sized graphitic disks with thickness down to 60 layers and measured their electrical properties. [64] As for theory, let me make only a short note (for more references, see Refs.…”
Section: Graphene Incarnationsmentioning
confidence: 99%
“…Indeed, the latest studies of chemically exfoliated graphite have shown that its sediments consist of restacked and scrolled multilayer sheets rather than individual monolayers (6)(7)(8). An alternative approach has been the use of mechanical cleavage (9)(10)(11)(12)(13)(14). The earlier reports described mechanically cleaved flakes consisting of tens and hundreds of layers, but the recently renewed interest in thin graphitic films led to flaky materials with a thickness of just a few graphene layers (12)(13)(14)(15).…”
mentioning
confidence: 99%
“…Experimental work to synthesize very thin graphitic layers directly on top of a substrate [3] or to extract using chemical [4], or mechanical [5,6] pathways has been demonstrated to produce graphitic samples with thicknesses ranging from 1 -100 nm. Systematic transport measurements have been carried out on mesoscopic graphitic disks [7] and cleaved bulk crystals [8] with sample thicknesses approaching ∼ 20 nm, exhibiting persisting bulk graphite properties at these length scales. However, electric field dependent charge transport has not been measured, due to the fact that the size of the samples and the geometry of the devices are inadequate for such a measurement.…”
mentioning
confidence: 99%