2011
DOI: 10.1016/j.jcrysgro.2011.07.025
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Size and distribution of Te inclusions in THM as-grown CZT wafers: The effect of the rate of crystal cooling

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Cited by 29 publications
(15 citation statements)
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“…[1][2][3][4] Unfortunately, these materials tend to have nonuniform properties, resulting in both limited performance and high material cost (arising from a low yield of usable portions of ingots). 1 The nonuniformity properties have been attributed to such defects as Te particles 5,6 and dislocation networks. 1,[7][8][9][10][11] Previous efforts to improve the materials have focused on reducing Te particles, but little work has focused on dislocation network structures.…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3][4] Unfortunately, these materials tend to have nonuniform properties, resulting in both limited performance and high material cost (arising from a low yield of usable portions of ingots). 1 The nonuniformity properties have been attributed to such defects as Te particles 5,6 and dislocation networks. 1,[7][8][9][10][11] Previous efforts to improve the materials have focused on reducing Te particles, but little work has focused on dislocation network structures.…”
Section: Introductionmentioning
confidence: 99%
“…The performance of the material is critically dependent on the presence of extended defects such as dislocations and grain boundaries and second phases, particularly tellurium precipitates and inclusions [3][4][5]. Vapour phase growth, by virtue of its lower temperatures and potential for greater control of the growth process, is able to address these problems and, by avoiding the use of a melt, should avoid the generation of tellurium inclusions.…”
Section: Introductionmentioning
confidence: 99%
“…The resistivity of the as-grown ingots varied between1 and 3 Â 10 10 O cm. The average concentration of Te inclusions/precipitations of the as-grown ingots found to be $1 Â 10 5 cm À 3 [19]. The as-grown crystals showed excellent charge transport characteristics with electron mobility of about 960 cm 2 /V sec and mt for electron about 9 Â 10 À 3 cm 2 /V at room temperature for 5 mm thick samples [20].…”
Section: Resultsmentioning
confidence: 92%