Six-Beam X-Ray Diffraction in Ge Single Crystals

Besirganyan, P. A.; Gabrielyan, R. Ts.; Kohn, V. G.; Toneyan, A. H.

doi:10.1002/pssa.2210850204

Cited by 6 publications

(6 citation statements)

References 10 publications

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“…Several experimental and theoretical works on six-beam cases can be found over the last four decades (Afanas'ev & Kohn, 1977;Besirganyan et al, 1984;Kohn & Toneyan, 1986;Kazimirov et al, 1993). The theoretical parts of these works were all based on the E-L theory.…”

Section: Figurementioning

confidence: 99%

Polarization-dependent X-ray six-beam pinhole topographs for a channel-cut silicon crystal

Okitsu¹,

Yoda²,

Imai³

et al. 2011

Acta Cryst Sect A

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It was pointed out in a previous paper [Okitsu et al. (2006), Acta Cryst. A62, 237-244] that an n-beam Takagi-Taupin (T-T) equation can be solved for a crystal of arbitrary shape. The procedure to integrate the n-beam T-T equation is to let all the Fourier coefficients of the electric susceptibility be zero at positions inside the Borrmann pyramid but outside the crystal. The efficiency of this simple procedure is verified in the present paper by showing qualitative and quantitative agreements between experimentally obtained and computer-simulated X-ray six-beam pinhole topographs for a channel-cut silicon crystal.

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Section: Figurementioning

confidence: 99%

Polarization-dependent X-ray six-beam pinhole topographs for a channel-cut silicon crystal

Okitsu¹,

Yoda²,

Imai³

et al. 2011

Acta Cryst Sect A

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“…This theory also describes the interference effects that appear when the Bragg condition is fulfilled for several reflections. This so-called multiple-beam X-ray diffraction (MBD) may result in enhancement or dampening of diffracted intensity (Renninger, 1937;Newville, 2021;Kohn, 1979;Kohn & Kazimirov, 2012;Besirganyan et al, 1984). In contrast, diffraction from slightly imperfect or small crystals can be described by the kinematic theory of diffraction as a small lattice coherence length prevents the multiple wave interference effect to a large extent (Holy ´et al, 1994;Krivoglaz, 1996;Juretschke, 1984).…”

Section: Introductionmentioning

confidence: 99%

Treatment of multiple-beam X-ray diffraction in energy-dependent measurements

Nentwich,

Zschornak,

Weigel

et al. 2024

J Synchrotron Radiat

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During X-ray diffraction experiments on single crystals, the diffracted beam intensities may be affected by multiple-beam X-ray diffraction (MBD). This effect is particularly frequent at higher X-ray energies and for larger unit cells. The appearance of this so-called Renninger effect often impairs the interpretation of diffracted intensities. This applies in particular to energy spectra analysed in resonant experiments, since during scans of the incident photon energy these conditions are necessarily met for specific X-ray energies. This effect can be addressed by carefully avoiding multiple-beam reflection conditions at a given X-ray energy and a given position in reciprocal space. However, areas which are (nearly) free of MBD are not always available. This article presents a universal concept of data acquisition and post-processing for resonant X-ray diffraction experiments. Our concept facilitates the reliable determination of kinematic (MBD-free) resonant diffraction intensities even at relatively high energies which, in turn, enables the study of higher absorption edges. This way, the applicability of resonant diffraction, e.g. to reveal the local atomic and electronic structure or chemical environment, is extended for a vast majority of crystalline materials. The potential of this approach compared with conventional data reduction is demonstrated by the measurements of the Ta L 3 edge of well studied lithium tantalate LiTaO3.

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“…It was observed, for instance, that anomalous transmission 17,18 becomes significantly stronger (up to 1000 times) with an increase in the number of beams involved in the diffraction. [19][20][21] However, a detailed theoretical analysis of multiple-beam diffraction becomes very difficult 21 and therefore numerical simulations are commonly used. [23][24][25] There are at least two differences between the developed approaches for multiple-beam dynamical x-ray diffraction from a (nearly) perfect crystal.…”

Section: Introductionmentioning

confidence: 99%

X-ray multiple diffraction from crystalline multilayers: Application to a 90° Bragg reflection

Souvorov¹,

Ishikawa²,

Nikulin³

et al. 2004

Phys. Rev. B

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A generalized solution to the problem of multiple-beam dynamical x-ray diffraction from single and layered crystals with vertical strain is presented. The new formalism embraces all possible diffraction geometries, including extreme cases of grazing and normal incidence and emergence. The expressions for the diffracted wave amplitudes were obtained as recursion formulas. Numerical simulations were implemented and shown to be computationally stable. The formalism was successfully tested using experimental data obtained from a SiC/Si single-layered structure in a 90°diffraction geometry.

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Six-Beam X-Ray Diffraction in Ge Single Crystals

Cited by 6 publications

References 10 publications

Polarization-dependent X-ray six-beam pinhole topographs for a channel-cut silicon crystal

Polarization-dependent X-ray six-beam pinhole topographs for a channel-cut silicon crystal

Treatment of multiple-beam X-ray diffraction in energy-dependent measurements

X-ray multiple diffraction from crystalline multilayers: Application to a 90° Bragg reflection

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