2016
DOI: 10.1039/c5nr08917d
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Sinusoidal nanotextures for light management in silicon thin-film solar cells

Abstract: a Recent progresses in liquid phase crystallization enabled the fabrication of thin wafer quality crystalline silicon layers on low-cost glass substrates enabling conversion efficiencies up to 12.1%. Because of its indirect band gap, a thin silicon absorber layer demands for efficient measures for light management. However, the combination of high quality crystalline silicon and light trapping structures is still a critical issue. Here, we implement hexagonal 750 nm pitched sinusoidal and pillar shaped nanostr… Show more

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Cited by 28 publications
(45 citation statements)
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References 29 publications
(43 reference statements)
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“…The experimental samples were prepared using a solid-phase crystallisation process, as described in Ref. [5]. The first-order correction resembles the experimental data much better than the zeroth-order correction.…”
Section: Resultsmentioning
confidence: 99%
“…The experimental samples were prepared using a solid-phase crystallisation process, as described in Ref. [5]. The first-order correction resembles the experimental data much better than the zeroth-order correction.…”
Section: Resultsmentioning
confidence: 99%
“…Finally, a 10 nm thin silicon oxide layer is sputtered on all three nanostructure types (1)-(3), serving as a passivation layer at the interface to the silicon absorber. More details can be found in references [4,5]. Silicon layers of 8-10 µm thickness are deposited onto these nanostructured superstrates by electron-beam evaporation at a temperature of 600°C resulting in nano-crystalline material.…”
Section: Methodsmentioning
confidence: 99%
“…However, the electronic material quality can be reduced by introducing nano-structures at this interface [2]. Two approaches were recently introduced that combine high electronic material quality LPC silicon with nanostructures, namely the sinusoidal structure [3] and the smooth anti-reflective three-dimensional (SMART) texture [4]. In this contribution, we investigate the angular dependence of the anti-reflective properties of these two structured LPC silicon absorbers compared to an optimized planar reference sample.…”
Section: Introductionmentioning
confidence: 99%