Singleshot and high-sensitivity detection of terahertz waveforms using phase-offset electro-optic sampling and an echelon mirror

Abstract

We implemented the single-shot terahertz spectrometer using an echelon mirror coupled with the phase-offset electro-optic sampling method. The single-shot sensitivity of the terahertz waveform approaches 1 V/cm, which opens a new possibility of detecting terahertz waveforms from various irreversible phenomena. Spectroscopy under pulsed high-magnet, terahertz spectral line imaging, and the terahertz spectroscopy of laser ablation processes are demonstrated. Pulse-to-pulse detection of the terahertz waveforms could bring new information on the ultrafast dynamics of materials and material processing.