2007
DOI: 10.1016/j.ijpe.2006.08.011
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Single-station performance evaluation and improvement in semiconductor manufacturing: A graphical approach

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Cited by 19 publications
(6 citation statements)
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“…All of these sources are from the healthcare sector, which highlights the opportunities for using Little's Law in situations where significant volumes of data can exist. There are also some papers where the data is used within a model to diagnose the causes of problems (such as Narahiri and Khan 1996;Li et al 2007) or evaluate future scenarios (Alfonso-Lizarazo et al 2013). With the advent of 'big data' and data science plus the future emergence of Industry 4.0, the need for Little's Law as a means to extrapolate performance data becomes less important.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…All of these sources are from the healthcare sector, which highlights the opportunities for using Little's Law in situations where significant volumes of data can exist. There are also some papers where the data is used within a model to diagnose the causes of problems (such as Narahiri and Khan 1996;Li et al 2007) or evaluate future scenarios (Alfonso-Lizarazo et al 2013). With the advent of 'big data' and data science plus the future emergence of Industry 4.0, the need for Little's Law as a means to extrapolate performance data becomes less important.…”
Section: Discussionmentioning
confidence: 99%
“…The factors identified in this paper may prove a useful test in evaluating this. A starting point may be Kingman's equation, which is suggested by Hopp and Spearman (2008) and also features in Klassen and Menor (2007) and Li et al (2007) although the Factory Physics based VUT (Variability, Utilisation, Time) Equation has also been used (Wang et al 2015). However other approaches are used in the papers examined from the scientific (Nyhuis and Vogel 2006) to the experiential (Harris 2010).…”
Section: Future Researchmentioning
confidence: 99%
“…However, for several reasons the technology is still underutilised: (1) simulation modeling is a time-consuming and knowledge-intensive process that requires knowledge not only about simulation but also about application and implementation tools; (2) most simulation models developed with current technology are 'rigid' customised ones that cannot be reused or easily adapted to other similar problems; and (3) transforming related knowledge and information from the application domain to simulation is an unstructured or ill-defined process that is dependent on the skill and experience of individual modelers [15]. The relationships between key indicators of manufacturing system performance, such as cycle time (CT), throughput (TH), utilisation, work-in-process (WIP), and the variability factor (to be defined shortly in this paper), are complicated and difficult to quantify [16]. For many companies, the key aspects of current competitiveness in order to raise customer satisfaction focus on delivery time, quality, and cost [17].…”
Section: Literature Reviewmentioning
confidence: 99%
“…Omar and Kumar, 2008) and several other applications. Li et al (2007) proposed a graphical approach to evaluate the performance of a single station in semiconductor manufacturing. Pradhan et al (2008) proposed analytical models to estimate performance measures for the problem under study when the job arrivals and service times were exponentially distributed.…”
Section: Literature Reviewmentioning
confidence: 99%