Abstract:We present a single shot low coherence white light Hilbert phase microscopy (WL-HPM) for quantitative phase imaging of Si opto-electronic devices, i.e., Si integrated circuits (Si-ICs) and Si solar cells. White light interferograms were recorded by a color CCD camera and the interferogram is decomposed into the three colors red, green and blue. Spatial carrier frequency of the WL interferogram was increased sufficiently by means of introducing a tilt in the interferometer. Hilbert transform fringe analysis was… Show more
“…3D image stitching methods are used to enlarge the lateral measuring range [186,187], and this technique is discussed in section 4.2.4. The combination of WLI with a color CCD camera has also been a research hotspot in recent years, which makes the MWI as simple as the one single wavelength case [188][189][190][191].…”
As high-precision measuring instruments have developed, interferometers have been widely applied in the measurement of lengths and of the shape of surfaces, with nanometer precision. The emergence of the laser is one of the revolutions that has led to a well-defined traceability route to the definition of the meter via interferometry. Another change is the ever-increasing adoption of detector arrays substituting for conventional methods of recording and analyzing interferograms. New applications have also arisen from the adoption of microscopes, optical fibers, chip-level components and diffractive optical elements, developing enhanced analogues of conventional interferometers, which have the advantages of high integration, low noise levels, and complete sets of measuring instruments with a high level of automation. Since the requirements for measurement parameters and the environment are becoming more complex, we expect that the related instruments will play a progressively significant role in the progress of advanced manufacturing processes and quality control. Multi-sensor integrated flexible measurement methods have been proposed to perform measurements with holistic, more accurate and reliable information. However, most of the proposed methods are not intelligent and are highly integrated, providing only specific solutions for given measuring tasks. In this paper, the principles, progress, prospects and development trends of interferometry are reviewed.
“…3D image stitching methods are used to enlarge the lateral measuring range [186,187], and this technique is discussed in section 4.2.4. The combination of WLI with a color CCD camera has also been a research hotspot in recent years, which makes the MWI as simple as the one single wavelength case [188][189][190][191].…”
As high-precision measuring instruments have developed, interferometers have been widely applied in the measurement of lengths and of the shape of surfaces, with nanometer precision. The emergence of the laser is one of the revolutions that has led to a well-defined traceability route to the definition of the meter via interferometry. Another change is the ever-increasing adoption of detector arrays substituting for conventional methods of recording and analyzing interferograms. New applications have also arisen from the adoption of microscopes, optical fibers, chip-level components and diffractive optical elements, developing enhanced analogues of conventional interferometers, which have the advantages of high integration, low noise levels, and complete sets of measuring instruments with a high level of automation. Since the requirements for measurement parameters and the environment are becoming more complex, we expect that the related instruments will play a progressively significant role in the progress of advanced manufacturing processes and quality control. Multi-sensor integrated flexible measurement methods have been proposed to perform measurements with holistic, more accurate and reliable information. However, most of the proposed methods are not intelligent and are highly integrated, providing only specific solutions for given measuring tasks. In this paper, the principles, progress, prospects and development trends of interferometry are reviewed.
“…Although PSI has the advantage of utilizing the full resolution of the system, requirement of multiple frames is the key obstacle in PSI for many applications such as live-cell imaging and measurement with dynamic samples [22]. To overcome these limitations, various singleshot phase-shifting approaches have been developed in the recent past [13,[23][24][25][26]. However, these approaches either suffer with complex experimental setups while using multiple charge couple device (CCD) cameras or significantly increases the cost of the system [17,23,26].…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, various single-shot phase-shifting approaches have been developed in the past. [17][18][19] These approaches suffer with complex experimental setups while using multiple CCD camera, and significantly increases the cost of the system. Other, approached such as using polarizer array for phase shifting purpose leads inefficient utilization of the CCD chip.…”
White light phase-shifting interference microscopy (WL-PSIM) is a prominent technique for high-resolution quantitative phase imaging (QPI) of industrial and biological specimens. However, multiple interferograms with accurate phaseshifts are essentially required in WL-PSIM for measuring the accurate phase of the object. Here, we present single-shot phase-shifting interferometric techniques for accurate phase measurement using filtered white light (520±36 nm) phase-shifting interference microscopy (F-WL-PSIM) and deep neural network (DNN). The methods are incorporated by training the DNN to generate (a) four phase-shifted frames and (b) direct phase from a single interferogram.
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