Single-shot readout of spin qubits with five-second coherence times

Anderson, Christopher P.; Glen, Elena O.; Zeledon, Cyrus; Bourassa, Alexandre; Yu, Jin; Zhu, Yizhi; Vorwerk, Christian; Crook, Alexander L.; Abe, Hiroshi; Ul-Hassan, Jawad; Ohshima, Takeshi; Són, Nguyên Tiên; Galli, Giulia; Awschalom, D. D.

doi:10.1364/quantum.2022.qtu3b.1

Cited by 2 publications

(2 citation statements)

References 14 publications

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“…We find that parameters for initialisation are different from the readout when optimised for the required success time and should be optimised separately. We believe that our treatment is also applicable and interesting to other systems like dopants in SiC or rare earth ions [28][29][30].…”

Section: Discussionmentioning

confidence: 93%

On readout and initialisation fidelity by finite demolition single shot readout

Zahedian,

Keller,

Kwon

et al. 2023

Quantum Sci. Technol.

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Ideal projective quantum measurement makes the system state collapse in one of the observable operator eigenstates | ϕ α ⟩ , making it a powerful tool for preparing the system in the desired pure state. Nevertheless, experimental realisations of projective measurement are not ideal. During the measurement time needed to overcome the classical noise of the apparatus, the system state is often (slightly) perturbed, which compromises the fidelity of initialisation. In this paper, we propose an analytical model to analyse the initialisation fidelity of the system performed by the single-shot readout. We derive a method to optimise parameters for the three most used cases of photon counting based readouts for NV colour centre in diamond, charge state, nuclear spin and low temperature electron spin readout. Our work is of relevance for the accurate description of initialisation fidelity of the quantum bit when the single-shot readout is used for initialisation via post-selection or real-time control.

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Section: Discussionmentioning

confidence: 93%

On readout and initialisation fidelity by finite demolition single shot readout

Zahedian,

Keller,

Kwon

et al. 2023

Quantum Sci. Technol.

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“…Silicon carbide (SiC) promises to bridge these gaps. SiC is a well established host of color centers that combine long spin coherence times [3], excellent brightness [4], room-temperature spin manipulation [5], ample nuclear spins [6], ultra-narrow inhomogeneous broadening [7], and emission wavelengths in the near-infrared and telecom bands [2]. Most importantly, SiC is available as a wafer-scale substrate, and its nanofabrication processes are CMOS compatible, making it a suitable platform for large-scale quantum nanophotonic hardware.…”

Section: Introductionmentioning

confidence: 99%

Wafer-Scale Integration of Freestanding Photonic Deviceswith Color Centers in Silicon Carbide

Majety,

Norman,

Saha

et al. 2024

Preprint

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Color center platforms have been at the forefront of quantum nanophotonics forapplications in quantum networking, computing, and sensing. However, large-scaledeployment of this technology has been stifled by a lack of ability to integrate photonicdevices at scale while maintaining the properties of quantum emitters. We address thischallenge in silicon carbide which has both commercially available wafer-scale substratesand is a host to color centers with desirable optical and spin properties. Using ionbeam etching at an angle, we develop a 5-inch wafer process for the fabrication oftriangular cross-section photonic devices in bulk 4H-SiC. The developed process has avariability in etch rate and etch angle of 5.4% and 2.9%, respectively. Furthermore, theintegrated color centers maintain their optical properties after the etch, thus achievingthe nanofabrication goal of wafer-scale nanofabrication in quantum-grade silicon carbide.

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Single-shot readout of spin qubits with five-second coherence times

Abstract: Single-shot readout of divacancy spin qubits in silicon carbide is demonstrated through spin-selective two-photon ionization and subsequent optical charge readout. With this readout, we measure single-spin coherence times of over five seconds.

Cited by 2 publications

References 14 publications

On readout and initialisation fidelity by finite demolition single shot readout

On readout and initialisation fidelity by finite demolition single shot readout

Wafer-Scale Integration of Freestanding Photonic Deviceswith Color Centers in Silicon Carbide

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