Optical Measurement Systems for Industrial Inspection X 2017
DOI: 10.1117/12.2270270
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Single-shot multilayer measurement by chromatic confocal coherence tomography

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Cited by 2 publications
(5 citation statements)
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“…They derived a quantitative evaluation of these errors and a method was presented for minimizing the influence of these errors. In 2017, Boettcher T et al [18] proposed a new hybrid single-shot imaging scheme that combined chromatic confocal and interference technology, to simultaneously measure the thickness and refractive index for translucent materials. In 2018, Zhang K et al [19] established a thickness measurement model by adding an auxiliary reflector below the specimen.…”
Section: Of 16mentioning
confidence: 99%
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“…They derived a quantitative evaluation of these errors and a method was presented for minimizing the influence of these errors. In 2017, Boettcher T et al [18] proposed a new hybrid single-shot imaging scheme that combined chromatic confocal and interference technology, to simultaneously measure the thickness and refractive index for translucent materials. In 2018, Zhang K et al [19] established a thickness measurement model by adding an auxiliary reflector below the specimen.…”
Section: Of 16mentioning
confidence: 99%
“…As the slide moves along the yellow arrow in Figure 9, several groups of H i and H 0 values can be obtained; however, the differences in each group, which can be represented as H i -H 0 , are not equal. Considering Equation (18), it is known that the thickness of the slide is not only related to the difference between H i and H 0 , but also related to the initial parameters of the measurement system. Therefore, the axial position of the slide along the yellow arrow was fixed.…”
Section: Thickness Measurement For Transparent Specimenmentioning
confidence: 99%
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