Single-shot beam-position monitor for x-ray free electron laser

Tono, Kensuke; Kudo, Togo; Yabashi, Makina; Tachibana, Takeshi; Feng, Yiping; Fritz, David; Hastings, J. B.; Ishikawa, Tetsuya

doi:10.1063/1.3549133

Cited by 98 publications

(60 citation statements)

References 14 publications

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“…This diamond film is the same as that used for monitoring the position and intensity of XFEL beam (34). The film thickness was 15 μm and the crystal grain size was ∼30 nm.…”

Section: Methodsmentioning

confidence: 99%

“…The distances between the sample and the MPCCD detectors were 205 mm for the 111 reflection and 260 mm for the 220 reflection. The pulse energies of the pump and the probe pulses were determined using a calibrated intensity monitor (34) installed at SACLA and a spectrometer located 5.5 m downstream of the focal point, consisting of the same diamond foil as the sample and an MPCCD detector to measure the diffraction intensities of the 111 reflection.…”

Section: Methodsmentioning

confidence: 99%

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Observation of femtosecond X-ray interactions with matter using an X-ray–X-ray pump–probe scheme

Inoue

Inubushi

Sato

et al. 2016

Proc. Natl. Acad. Sci. U.S.A.

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Resolution in the X-ray structure determination of noncrystalline samples has been limited to several tens of nanometers, because deep X-ray irradiation required for enhanced resolution causes radiation damage to samples. However, theoretical studies predict that the femtosecond (fs) durations of X-ray free-electron laser (XFEL) pulses make it possible to record scattering signals before the initiation of X-ray damage processes; thus, an ultraintense X-ray beam can be used beyond the conventional limit of radiation dose. Here, we verify this scenario by directly observing femtosecond X-ray damage processes in diamond irradiated with extraordinarily intense (∼10 19 W/cm 2 ) XFEL pulses. An X-ray pump-probe diffraction scheme was developed in this study; tightly focused double-5-fs XFEL pulses with time separations ranging from sub-fs to 80 fs were used to excite (i.e., pump) the diamond and characterize (i.e., probe) the temporal changes of the crystalline structures through Bragg reflection. It was found that the pump and probe diffraction intensities remain almost constant for shorter time separations of the double pulse, whereas the probe diffraction intensities decreased after 20 fs following pump pulse irradiation due to the X-ray-induced atomic displacement. This result indicates that sub-10-fs XFEL pulses enable conductions of damageless structural determinations and supports the validity of the theoretical predictions of ultraintense X-ray-matter interactions. The X-ray pump-probe scheme demonstrated here would be effective for understanding ultraintense X-ray-matter interactions, which will greatly stimulate advanced XFEL applications, such as atomic structure determination of a single molecule and generation of exotic matters with high energy densities.X-ray free-electron laser | pump-probe | femtosecond X-ray damage S ince W. C. Röntgen discovered X-rays emitted from vacuum tube equipment in 1895, scientists have continuously endeavored to develop brighter X-ray sources throughout the 20th century. One of the most remarkable breakthroughs was the emergence of synchrotron light sources, which were much more brilliant than the early lab-based X-ray sources. Such dramatic increase in X-ray brilliance provided a pathway to obtain high-quality X-ray scattering data. This, in turn, enabled one to solve the structures of complex systems such as proteins, functional units of living organisms, and viruses. However, the increase in the brilliance is also accompanied by a severe problem of X-ray radiation damage to the samples being examined (1). X-rays ionize atoms and generate highly activated radicals that break chemical bonds and cause changes in the structures of the samples. To achieve structure determination precisely, a sufficient scattering signal should be recorded before the samples are severely damaged. Radiation damage was considered to be an intrinsic problem associated with X-ray scattering experiments, which imposed a fundamental limit on the resolution in X-ray structure determination (2).The rec...

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“…This diamond film is the same as that used for monitoring the position and intensity of XFEL beam (34). The film thickness was 15 μm and the crystal grain size was ∼30 nm.…”

Section: Methodsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Observation of femtosecond X-ray interactions with matter using an X-ray–X-ray pump–probe scheme

Inoue

Inubushi

Sato

et al. 2016

Proc. Natl. Acad. Sci. U.S.A.

Self Cite

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show abstract

“…The pulse length was not measured but was estimated to be about 10 fs (FWHM) [43]. XFEL pulse energies were measured by the beamposition monitor [44] located upstream of the beam line. The monitor was calibrated by a calorimeter [45] so that output signals from the monitor could be transformed into the absolute value of the pulse energy, which was 235 μJ on average.…”

Section: Experimental Methodsmentioning

confidence: 99%

Ultrafast Dynamics of a Nucleobase Analogue Illuminated by a Short Intense X-ray Free Electron Laser Pulse

Nagaya¹,

Motomura²,

Kukk³

et al. 2016

Phys. Rev. X

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“…Although the spectral resolution is limited to 100 eV at around 10 keV, which is larger than the SASE spectral width, it covers a single-shot spectral range of more than 2 keV. The pulse energies estimated from the integrated spectral area of the in-line spectrometer relatively agrees with a calibrated intensity monitor 32 …”

Section: Methodsmentioning

confidence: 66%

Two-colour hard X-ray free-electron laser with wide tunability

et al. 2013

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Ultrabrilliant, femtosecond X-ray pulses from X-ray free-electron lasers (XFELs) have promoted the investigation of exotic interactions between intense X-rays and matters, and the observation of minute targets with high spatio-temporal resolution. Although a single X-ray beam has been utilized for these experiments, the use of multiple beams with flexible and optimum beam parameters should drastically enhance the capability and potentiality of XFELs. Here we show a new light source of a two-colour double-pulse (TCDP) XFEL in hard X-rays using variable-gap undulators, which realizes a large and flexible wavelength separation of more than 30% with an ultraprecisely controlled time interval in the attosecond regime. Together with sub-10-fs pulse duration and multi-gigawatt peak powers, the TCDP scheme enables us to elucidate X-ray-induced ultrafast transitions of electronic states and structures, which will significantly contribute to the advancement of ultrafast chemistry, plasma and astronomical physics, and quantum X-ray optics.

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Single-shot beam-position monitor for x-ray free electron laser

Cited by 98 publications

References 14 publications

Observation of femtosecond X-ray interactions with matter using an X-ray–X-ray pump–probe scheme

Observation of femtosecond X-ray interactions with matter using an X-ray–X-ray pump–probe scheme

Ultrafast Dynamics of a Nucleobase Analogue Illuminated by a Short Intense X-ray Free Electron Laser Pulse

Two-colour hard X-ray free-electron laser with wide tunability

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