Single-Probe Inductively Coupled In-Circuit Impedance Measurement

Weerasinghe, Arjuna; Narampanawe, Nishshanka Bandara; Yang, Zhenning; Svimonishvili, Tengiz; See, Kye Yak

doi:10.1109/temc.2021.3091761

Cited by 20 publications

(17 citation statements)

References 19 publications

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“…The FD-SPS was developed to eliminate the probe-toprobe coupling issue encountered by the FD-TPS and TD-TPS [18]. The FD-SPS has been employed to extract the common-mode (CM) and differential-mode (DM) impedances of motor drive systems [19], [20].…”

Section: Frequency-domain Single-probe Setupmentioning

confidence: 99%

“…VNA). It can also incorporate a SAP module for applications where strong noise and power surges are present [18]. To measure , the VNA generates a stepped swept-sine excitation through its internal signal source and provides the reflection coefficient at m-m' denoted by % & .…”

Section: Frequency-domain Single-probe Setupmentioning

confidence: 99%

“…, ' and ' are frequency-dependent intrinsic parameters of the SPS. By performing a calibration to the in-circuit measurement [18], ' , ' and ' of a given SPS can be determined so that can be obtained from ( 6) based on the measured % & . It should be mentioned that the FD-SPS is usually applied for time-invariant in-circuit impedance measurement.…”

Section: Frequency-domain Single-probe Setupmentioning

confidence: 99%

“…To measure the in-circuit impedance of one SUT, the measurement setups of the inductive coupling approach can be mainly divided into the frequency-domain two-probe setup (FD-TPS) [9]- [13], the time-domain two-probe setup (TD-TPS) [14]- [17] and the frequency-domain single-probe setup (FD-SPS) [18]- [20]. Besides, the multi-probe setup (MPS) was also designed but it is for simultaneous measurement of in-circuit impedances of multiple SUTs in multi-branches powered by the same power source [21], [22].…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

In-Circuit Impedance Measurement Setups of Inductive Coupling Approach: A Review

Fan¹,

Jie²,

Yang³

et al. 2022

Preprint

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In-circuit impedance measurement provides useful information for many EMC applications. The inductive coupling approach is a promising in-circuit impedance measurement method due to its non-contact characteristics and simple on-site implementation. Many measurement setups of this approach were reported. However, a comprehensive survey and comparison of these setups have not been found in the literature. This paper reviews these setups in terms of their characteristics, limitations, and applications. In addition, recommendations for future research are also presented.

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Section: Frequency-domain Single-probe Setupmentioning

confidence: 99%

Section: Frequency-domain Single-probe Setupmentioning

confidence: 99%

Section: Frequency-domain Single-probe Setupmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

In-Circuit Impedance Measurement Setups of Inductive Coupling Approach: A Review

Fan¹,

Jie²,

Yang³

et al. 2022

Preprint

Self Cite

View full text Add to dashboard Cite

show abstract

“…, ' and ' are frequency-dependent intrinsic parameters of the SPS. By performing a calibration prior to the in-circuit measurement [18], ' , ' and ' of a given SPS can be determined so that can be obtained from ( 6) based on the measured % & . It should be mentioned that the FD-SPS is usually applied for time-invariant in-circuit impedance measurement.…”

Section: Frequency-domain Single-probe Setupmentioning

confidence: 99%