2015
DOI: 10.1364/optica.2.000347
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Single-photon emission from localized excitons in an atomically thin semiconductor

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Cited by 432 publications
(588 citation statements)
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“…These structural defects and/or local strain are possibly the origin of the narrow-line emission. Studies performed by several groups [84][85][86][87][88] confirmed single photon emission from defect centers by photon antibunching measurements (Figure 7c). Second-order autocorreleation factors g (2) (0) in the range between 0.14 and 0.36 were determined.…”
Section: Single Photon Emittersmentioning
confidence: 59%
“…These structural defects and/or local strain are possibly the origin of the narrow-line emission. Studies performed by several groups [84][85][86][87][88] confirmed single photon emission from defect centers by photon antibunching measurements (Figure 7c). Second-order autocorreleation factors g (2) (0) in the range between 0.14 and 0.36 were determined.…”
Section: Single Photon Emittersmentioning
confidence: 59%
“…Our scheme for valley pseudospin manipulation should also extend to the recently discovered quantum-confined states of excitons in TMDC layers [29][30][31][32][33] . For these localized excitonic states, the valley pseudospin degree of freedom is expected to be well preserved 34 , but their lifetimes are far longer than for the free excitons examined in this work.…”
mentioning
confidence: 96%
“…FWHM of 150-400 leV, similar to those found in WSe 2 MLs. [24][25][26][27][28][29] The top and the bottom panels of Fig. 1(b) show two sets of QD-like PL spectra which were taken from samples 1 and 2.…”
mentioning
confidence: 99%