Large linear negative magnetoresistance (LNMR) was measured in a GaAs/ Al x Ga 1−x As two-dimensional electron system with nonplanar topography, caused by random distribution of corrugations, generated by a combination of prepatterning and regrowth processes. Even though the LNMR reaches up to 20% of the zero field resistivity ͓ xx ͑B =0͔͒, in a very small region around B = 0, the resistivity shows a nonanomalous behavior. From comparison with a recent theory development for the conductivity of a classical two-dimensional Lorentz gas, and numerical calculations of the electron dynamics in systems with random electrostatic potentials, performed by us, we argue that the observed MR is mainly due to non-Markovian memory effects originated by specific return processes in backscattering of electrons by corrugations and defects.