A low-energy electron point-source projection microscope that uses a metal/insulator structure as source instead of a sharp metal needle is presented. By combining this source with an electron optical lens and a high spatial resolution image detector, performances comparable to those of a normal electron projection microscope are easily accessible and presented here. The accessible electron energy range extends from 100eV to 1000eV. In the example presented here, instead of the usual near-field source-object distance, long-range imaging at a distance of about 600µm is achieved. 1-Introduction The normal low-energy electron point-source projection microscope [1,2,3,4] is a lensless system where an electron point source illuminates a perforated object, and the "physical shadow" of the object is recorded on a more distant fluorescent screen. The so-called physical shadow corresponds to the interference between the reference wave that comes directly from the source and the object wave that results from object scattering. This Fresnel interference pattern is an electronic hologram of the object. Numerical reconstruction yields an image of the object in its position during the recording [5,6,7].The projection microscope is known to reach a magnification of about 10 5 with an experimental spatial resolution of about 1nm [8,9,10]. These