2020 IEEE Radiation Effects Data Workshop (In Conjunction With 2020 NSREC) 2020
DOI: 10.1109/redw51883.2020.9325847
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Single Event Upset Results from the Radiation Hardened Electronic Memory Experiment in a Polar Orbit

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“…Many of these monitors are based on sophisticated radiation monitors that can detect different kinds of particles and resolve their energy [1,2]. Others are based on low-cost detectors, e.g., static random access memories (SRAMs) that can characterize the radiation environment by measuring single-event upsets (SEU) or single-event latchups (SEL) [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17]. Often these radiation monitors can also be used to characterize beams at facilities.…”
mentioning
confidence: 99%
“…Many of these monitors are based on sophisticated radiation monitors that can detect different kinds of particles and resolve their energy [1,2]. Others are based on low-cost detectors, e.g., static random access memories (SRAMs) that can characterize the radiation environment by measuring single-event upsets (SEU) or single-event latchups (SEL) [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17]. Often these radiation monitors can also be used to characterize beams at facilities.…”
mentioning
confidence: 99%