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2007 9th European Conference on Radiation and Its Effects on Components and Systems 2007
DOI: 10.1109/radecs.2007.5205563
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Single Event Effects (SEE) response of embedded power PCs in a Xilinx Virtex-4 FPGA for a space application

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Cited by 11 publications
(3 citation statements)
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“…Time to SEFI cross sections will be calculated. We have seen a notable difference in performance between the external scrubber and the internal scrubber within the FX60 Power PC tests performed by our group [8]. More data is currently being analyzed.…”
Section: B Malfunction Categorizationmentioning
confidence: 89%
“…Time to SEFI cross sections will be calculated. We have seen a notable difference in performance between the external scrubber and the internal scrubber within the FX60 Power PC tests performed by our group [8]. More data is currently being analyzed.…”
Section: B Malfunction Categorizationmentioning
confidence: 89%
“…This specific FPGA was the subject of radiation testing and characterization by many groups including, but not limited to the Xilinx Radiation Test Consortium and the GSFC Radiation Effects and Analysis Group [10][11][12][13][14][15][16].…”
Section: Space Cube V10 Descriptionmentioning
confidence: 99%
“…We present in another paper a more detailed scrubbing comparison illustrating that all scrub-able resources have practically no error while implementing external scrubbing. However, the other scrubbing techniques have a notable cross-section [4]. Fig.…”
Section: ) Performing a Testmentioning
confidence: 99%