Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories

Wilcox, Edward P.; Joplin, Matthew B.; Berg, Melanie D.

doi:10.1109/redw61050.2023.10265834

2023 IEEE Radiation Effects Data Workshop (REDW) (In Conjunction With 2023 NSREC) 2023

DOI: 10.1109/redw61050.2023.10265834

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Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories

Edward P. Wilcox,

Matthew B. Joplin,

Melanie D. Berg

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Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories

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