Single Event Effects and Their Mitigation for the Collider Detector at Fermilab

Abstract

Abstract-We present an overview of radiation induced failures and operational experiences from the Collider Detector at Fermilab (CDF). In our summary, we examine single event effects (SEE) in electronics located in and around the detector. We present results of experiments to identify the sources and composition of the radiation and steps to reduce the rate of SEEs in our electronics. Our studies have led to a better, more complete understanding of the radiation environment in a modern hadron collider experiment.Index Terms-Radiation damage, single event effects, single event upset, single event burn-out, ionizing radiation, radiation field.

Particle interaction and displacement damage in silicon devices operated in radiation environments

“…Electronic devices located close to a beam or to an interaction point have shown SEE vulnerability. Observation of SEE occurrences have been reported by the CDF experiment [389] at the Tevatron Collider. Failures of power supplies feeding readout electronics and crates, loss of control function, data corruption etc occurred in systems located on the detector or close to it when beams were in operation.…”