Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter

Ren, Yi; Fan, Lingling; Chen, Li; Wen, Shi-Jie; Wong, Rick; Vonno, N. W. van; Witulski, A.F.; Bhuva, B. L.

doi:10.1007/s10836-012-5338-8

Cited by 8 publications

(3 citation statements)

References 14 publications

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“…The test circuit is shown in Fig. 2 [16]. The three soft-start pins, namely SS1/EN1, SS2/EN2 and SS3/EN3, are grounded through a capacitor for each pin.…”

Section: A Device Under Test (Dut)mentioning

confidence: 99%

“…This controller chip is sensitive to neutrons and alpha particles on ground level testing. The most sensitive area was decided to be nine bipolar transistors (used as a delta V be generator) inside a bandgap sub-circuit with a pulsed laser in our previous studies [16]. This controller chip requires low critical charge to generate the SET pulses, making it an ideal study case for low LET particles.…”

Section: Introductionmentioning

confidence: 99%

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Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller

et al. 2013

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Pulsed laser and heavy-ion experiments were carried out on a commercial-off-the-shelf DC/DC pulse width modulation controller to study the equivalent laser Linear Energy Transfer (LET) at wavelengths of 750 nm, 800 nm, 850 nm and 920 nm. The laser experiments showed that the shorter wavelength laser has smaller threshold energy to generate single-event transient pulses. The cross-sections versus heavy-ion LET and laser energy per pulse were obtained and correlated. The heavy-ion and laser cross-sections fit well considering the effects of metal layers on the chip. The results of this research facilitate the future pulsed laser testing by providing explicit coefficients to evaluate the equivalent laser LET, which can be used to replace costly heavy-ion testing.

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“…The test circuit is shown in Fig. 2 [16]. The three soft-start pins, namely SS1/EN1, SS2/EN2 and SS3/EN3, are grounded through a capacitor for each pin.…”

Section: A Device Under Test (Dut)mentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller

et al. 2013

Self Cite

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“…As a result, SETs in bandgap reference circuits dramatically affect the performance and function of the circuits and systems. The bandgap reference is reported to be increasingly sensitive to SETs in recent years [3], [4]. Although there are a large number of studies on radiation hardened analog/mix signal circuits, such as phase loop locks (PLLs) and amplifiers [5]- [21], there are not many papers dedicated to the topic of hardening the bandgap reference circuits.…”

Section: Introductionmentioning

confidence: 99%

An RHBD Bandgap Reference Utilizing Single Event Transient Isolation Technique

Ren

Chen

2016

IEEE Trans. Nucl. Sci.

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A novel radiation-hardened-by-design (RHBD) structure to reduce the single event transient (SET) amplitude in analog circuits is presented in this paper. This structure features an SET isolation technique, which contains a sensor and a switch. The sensor turns off the switch when it detects a voltage transient at the sensitive node, in which case the core circuit is temporarily isolated from the output. Once the voltage at the sensitive node recovers, the sensor turns on the switch again in order to connect the core circuit to the output. This RHBD technique was validated based on a typical bandgap reference circuit, which was fabricated in the IBM 130 nm technology. The simulation results demonstrated a significant reduction in the SET amplitude, which was further verified with the pulsed laser. The additional sensor and the switch in the circuit only produce a minor amount of additional power dissipation if they are properly chosen. The area overhead is rendered negligible by means of selecting the appropriate sizes of transistors for the RHBD structure.Index Terms-Bandgap reference, pulsed laser, radiation hardened by design (RHBD), SET isolation, single event transient (SET).

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Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser

Ren

Shi

et al. 2014

J Electron Test

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Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter

Cited by 8 publications

References 14 publications

Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller

Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller

An RHBD Bandgap Reference Utilizing Single Event Transient Isolation Technique

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser

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