Single event and TREE latchup mitigation for a star tracker sensor: An innovative approach to system level latchup mitigation

Abstract

This paper presents an innovative "blink" approach rather than the typical "operate through" approach to achieve system level latchup mitigation on a prototype star tracker camera. Included are circuit designs, flash x-ray test data, and heavy ion data demonstrating latchup mitigation protecting m icro-electronics from current latchup and burnout due to Single Event Latchup (SEL) and Transient Radiation Effects on Electronics (TREE).