Single-cycle atomic force microscope force reconstruction: resolving time-dependent interactions

Santos, Sérgio; Gadelrab, Karim; Font, Josep; Chiesa, Matteo

doi:10.1088/1367-2630/15/8/083034

Cited by 13 publications

(19 citation statements)

References 88 publications

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“…modal analysis, the force is localized at the end of the cantilever and modeled with a delta function as in (10). 83 The boundary conditions, however, are those of a free vibrating cantilever so the mode shapes can be evaluated in this way and employed to reconstruct the force. The tip-sample force that is being probed however is in fact acting normally to the cantilever axis.…”

Section: Transient Phenomena and The Differential Quadrature Methods (mentioning

confidence: 99%

“…We then discuss a formalism based on the differential form of the equation of motion for standard rectangular cantilevers that has been recently put forward. 83 The formalism accounts for base motion, which is standard in commercial AFM systems, and also accounts for higher exural modes and higher harmonics. From this formalism, a close form solution is found and expressed in terms of experimental observables.…”

Section: 5182mentioning

confidence: 99%

“…We term this second formalism the single cycle method and show that it is as powerful as the modal analysis method in the steady state. 83 With the single cycle method however, and by monitoring the wave prole of the cantilever at a nite number of locations on its longitudinal axis, transient phenomena can be probed, in principle, with sub-microsecond resolution. A discussion about the high temporal resolution of the method is given in terms of its potential to be employed experimentally to probe fast processes from those involved in phase transformation 84 and other irreversible interactions 23 to complex and fast biological phenomena.…”

Section: 5182mentioning

confidence: 99%

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Single cycle and transient force measurements in dynamic atomic force microscopy

Gadelrab¹,

Santos²,

Font

et al. 2013

Nanoscale

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The monitoring of the deflection of a micro-cantilever, as the end of a sharp probe mounted at its end, i.e. the tip, interacts with a surface, forms the foundation of atomic force microscopy AFM. In a nutshell, developments in the field are driven by the requirement of obtaining ever increasing throughput and sensitivity, and enhancing the versatility of the instrument to simultaneously map the topography and quantify nanoscale processes and properties. In the most common dynamic mode of operation, the motion of the driven cantilever is monitored at a single point on its longitudinal axis. Here, we show that from this single point a waveform is obtained that contains all the details about conservative and dissipative interactions. Then a formalism that accounts for multiple arbitrary flexural modes is developed for an indirectly driven cantilever. The formalism is shown to allow recovery of the details of the interaction even in the presence of complex and relevant hysteretic forces when the cantilever oscillates in the steady state. In a different approach, we develop a formalism that monitors the wave profile of the cantilever, i.e. the waveform at five different points on its longitudinal axis. With this formalism the interaction can be reconstructed during a single oscillation cycle even in the transient state of oscillation. Finally, we discuss the potential and advantages of the proposed methods and future technical challenges. Other standard and state of the art techniques and methods are also discussed and compared with the ones presented here. This work should also provide insight into the current high throughput-high sensitivity developments dealing with multifrequency dynamic AFM where information is recovered from multiple eigenmodes.

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Section: Transient Phenomena and The Differential Quadrature Methods (mentioning

confidence: 99%

Section: 5182mentioning

confidence: 99%

Section: 5182mentioning

confidence: 99%

See 1 more Smart Citation

Single cycle and transient force measurements in dynamic atomic force microscopy

Gadelrab¹,

Santos²,

Font

et al. 2013

Nanoscale

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“…Definitely, the investigation of the amplitude and phase behavior in the transient regime will increase significantly the speed of imaging and accuracy. Santos and Gaderlab [10] investigated the tip-sample force in transient behavior. Sahoo et al [11] increased the speed of imaging and control of AFM by studying the transient motion of cantilever signal.…”

Section: Introductionmentioning

confidence: 99%

Resonance‐Size Parameter Relationship and Dynamics of an AFM Subjected to Multimode Excitation and Based on the Modified Couple Stress Theory

Lin

Chang

2019

Mathematical Problems in Engineering

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The mathematical model of AFM probe subjected to multimode excitation based on the modified couple stress theory is presented. The semianalytical solution of the system is proposed. The transient behavior and response spectrum of AFM probe subjected to multimode excitation are investigated. It is very helpful to predict the nanotopography and surface properties based on the response of multimodes excitation. The effects of the root excitation, size parameter, and interacting distance on the response spectrum and frequency shift are investigated. The resonant frequency relation of the two systems with different size parameters is discovered and expressed in a formula. The natural frequencies predicted via the formula and those determined by the semianalytical method are significantly consistent.

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“…curves [24] from amplitude and phase distance (APD) curves collected on CaF 2 crystals containing water patches on their surface. We then compared the obtained profiles with those observed under low humidity conditions, i.e., when water is not present on the crystals.…”

Section: Introductionmentioning

confidence: 99%

Capillary and van der Waals interactions on CaF2 crystals from amplitude modulation AFM force reconstruction profiles under ambient conditions

Calò¹,

Robles²,

Santos³

et al. 2016

Nano Online

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There has been much interest in the past two decades to produce experimental force profiles characteristic of the interaction between nanoscale objects or a nanoscale object and a plane. Arguably, the advent of the atomic force microscope AFM was instrumental in driving such efforts because, in principle, force profiles could be recovered directly. Nevertheless, it has taken years before techniques have developed enough as to recover the attractive part of the force with relatively low noise and without missing information on critical ranges, particularly under ambient conditions where capillary interactions are believed to dominate. Thus a systematic study of the different profiles that may arise in such situations is still lacking. Here we employ the surfaces of CaF 2 , on which nanoscale water films form, to report on the range and force profiles that might originate by dynamic capillary interactions occurring between an AFM tip and nanoscale water patches. Three types of force profiles were observed under ambient conditions. One in which the force decay resembles the well-known inverse-square law typical of van der Waals interactions during the first 0.5-1 nm of decay, a second one in which the force decays almost linearly, in relatively good agreement with capillary force predicted by the constant chemical potential approximation, and a third one in which the attractive force is almost constant, i.e., forms a plateau, up to 3-4 nm above the surface when the formation of a capillary neck dominates the tip-sample interaction.

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Single-cycle atomic force microscope force reconstruction: resolving time-dependent interactions

Cited by 13 publications

References 88 publications

Single cycle and transient force measurements in dynamic atomic force microscopy

Single cycle and transient force measurements in dynamic atomic force microscopy

Resonance‐Size Parameter Relationship and Dynamics of an AFM Subjected to Multimode Excitation and Based on the Modified Couple Stress Theory

Capillary and van der Waals interactions on CaF2 crystals from amplitude modulation AFM force reconstruction profiles under ambient conditions

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