2022
DOI: 10.1039/d1ce01715b
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Single crystalline Ge thin film growth on c-plane sapphire substrates by molecular beam epitaxy (MBE)

Abstract: Single crystalline Ge has been grown on c-plane sapphire substrates by molecular beam epitaxy. Direct growth of Ge on sapphire results in three-dimensional (3D) Ge islands, two growth directions, more...

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Cited by 8 publications
(6 citation statements)
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References 25 publications
(42 reference statements)
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“…Common to the x-ray diffraction from all of the samples, the shoulder at the right side of the Ge (111) peak corresponded to the thin AlAs layer. This was confirmed by the growth of a reference sample without the AlAs 10 nm wetting layer, for which the shoulder peak was not observed on the XRD spectrum [10].…”
Section: Resultsmentioning
confidence: 64%
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“…Common to the x-ray diffraction from all of the samples, the shoulder at the right side of the Ge (111) peak corresponded to the thin AlAs layer. This was confirmed by the growth of a reference sample without the AlAs 10 nm wetting layer, for which the shoulder peak was not observed on the XRD spectrum [10].…”
Section: Resultsmentioning
confidence: 64%
“…To address this challenge in microwave photonics, we pursued the fabrication of a monolithic integrated group IV GeSn semiconductor laser [10][11][12] on a sapphire substrate. The choice to investigate the sapphire platform was based on several advantages it has over current silicon technology, such as (1) significantly greater immunity to the defects of space radiation [13,14], (2) high index contrast for efficient waveguides [15][16][17], (3) nearly perfect thermal expansion match to Group IV and III-V semiconductors for durability [18], and (4) the flexibility to support the monolithic fabrication of both laser and photonic integrated circuits on one platform, allowing higher function at a reduced cost.…”
Section: Introductionmentioning
confidence: 99%
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“…Before starting the growth, all of the substrates were annealed at 1200 °C for 4 h, which is important for making clean and atomically flat sapphire substrates. 15 After that, a 1 μm thick Ti film was deposited on the backside of each substrate for uniform and efficient heating. 16 Then, the substrates were introduced into the load lock chamber and heated at 200 °C for 2 h to remove the water vapor.…”
Section: Methodsmentioning
confidence: 99%
“…Surfacenet GmbH, Germany, supplied the substrates used in this experiment. Before starting the growth, all of the substrates were annealed at 1200 °C for 4 h, which is important for making clean and atomically flat sapphire substrates . After that, a 1 μm thick Ti film was deposited on the backside of each substrate for uniform and efficient heating .…”
Section: Methodsmentioning
confidence: 99%