Single beam interferometric angle measurement

Paolino, Pierdomenico; Bellon, Ludovic

doi:10.1016/j.optcom.2007.07.060

Cited by 16 publications

(5 citation statements)

References 11 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The analyzing area is thus the same for all the measurement configurations. It is based the quadrature phase technique we have developed 18,19 , as illustrated on Fig. 5: the light is separated in two equivalent arms (indexed with subscript n = 1, 2) with a non polarizing cube beam splitter, then focused on the photodetectors by lenses L n (focal length 25 mm).…”

Section: B Interferometer: Analysis Areamentioning

confidence: 99%

Quadrature phase interferometer for high resolution force spectroscopy

Paolino

Sandoval

Bellon

2013

Review of Scientific Instruments

View full text Add to dashboard Cite

In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the cantilever tip and a reference beam reflecting on the static base of the sensor. A design with very low environmental susceptibility and another allowing calibrated measurements on a wide spectral range are described. Both enable a very high resolution (down to 2.5×10(-15) m/√Hz), illustrated by thermal noise measurements on AFM cantilevers. They present an excellent long-term stability and a constant sensitivity independent of the optical phase of the interferometer. A quick review shows that our precision is equaling or out-performing the best results reported in the literature, but for a much larger deflection range, up to a few μm.

show abstract

Section: B Interferometer: Analysis Areamentioning

confidence: 99%

Quadrature phase interferometer for high resolution force spectroscopy

Paolino

Sandoval

Bellon

2013

Review of Scientific Instruments

View full text Add to dashboard Cite

show abstract

“…The minimum intensity position corresponding to the Brewster angle can be found by scanning the incident angle. The measurement accuracy of the refractive index depends on that of the angle [ 29 , 30 ]. The Brewster method enables simple and efficient measurement of the refractive index.…”

Section: Introductionmentioning

confidence: 99%

Refractive Index Measurement of Glass with Arbitrary Shape Based on Brewster’s Law and a Focusing Probe Beam

Hao

2021

Sensors

View full text Add to dashboard Cite

The refractive index is one of the most important parameters of optical glasses and has a significant effect on optical properties. The measurement of optical glasses, especially for optical elements such as lenses, is urgently needed. However, several presented methods require the immersion of the sample in liquid and provide indirect measurements, while others require structural parameters as priori knowledge, which is complex and time-consuming. In this study, a Brewster-Law-based direct and simple measurement method for the refractive index of glasses with arbitrary shapes is proposed, and a laser beam is focused on the surface of the sample as a probe. The incident angle of the chief ray is close to the Brewster angle. The reflected light is collected by an array detector. The refractive index is calculated from the minimum intensity position obtained with image processing. Additionally, a symmetric measurement scheme is proposed to improve the accuracy. Using these methods, a prism and four spherical lens samples with different refractive indices or radii of curvature are tested and error analyses are carried out. Results indicate that the accuracy can reach 10−4.

show abstract

“…They have attracted much attention, especially in the development of a stable laser light source, which makes it possible for use in industry [1]. As a result, the optical angle measurement method has seen widespread application, and the development of diverse optical angle-measuring methods.…”

Section: Introduction 11 Background and Motivationmentioning

confidence: 99%

High precision circular plane system for angular measurement

Yuan¹

2021

Preprint

View full text Add to dashboard Cite

The purpose of this project is to increase the measurement accuracy of the rotation angle and measurement speed. There is one rotatable circular plane with many holes in it, the initial location of this circular plane is stored in a CCD camera and is regarded as a stationary circular plane. When the rotatable circular plane is rotated, the intensity of the light across the holes of two circular planes is changed. This intensity will represent the position of the rotatable circular plane, so the position of that plane can be measured by calculating the intensities of light access between the two planes. In this project, several methods are proposed to increase the accuracy of measurement. To prevent a non- concentricity problem between two circular planes, only one circular plane is used in this system. To reduce the dfficulties in the fabrication process, holes will be used instead of using traditional slits. To increase the reading and calculation speed, an FPGA will be used in this system. For improving sampling accuracy, a Kalman filter is used. Overall, this system can reach an accuracy of 2:2176* 10-5 degree with all angles.

show abstract

Single beam interferometric angle measurement

Cited by 16 publications

References 11 publications

Quadrature phase interferometer for high resolution force spectroscopy

Quadrature phase interferometer for high resolution force spectroscopy

Refractive Index Measurement of Glass with Arbitrary Shape Based on Brewster’s Law and a Focusing Probe Beam

High precision circular plane system for angular measurement

Contact Info

Product

Resources

About