2011
DOI: 10.1051/epjap/2011100414
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Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM

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Cited by 38 publications
(26 citation statements)
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“…"Atomic-resolution imaging was reached with small chromatic aberration and a large uniform phase". This work is a continuation of that of Suenaga et al [177,178].…”
Section: Jeol Crest R005 and CCC (Triple C)supporting
confidence: 58%
See 1 more Smart Citation
“…"Atomic-resolution imaging was reached with small chromatic aberration and a large uniform phase". This work is a continuation of that of Suenaga et al [177,178].…”
Section: Jeol Crest R005 and CCC (Triple C)supporting
confidence: 58%
“…Correction of the spherical aberration of a 200 kV TEM by means of a hexapole corrector.Optik 99,[167][168][169][170][171][172][173][174][175][176][177][178][179] M Haider, G. Braunshausen and E. Schwan (1995)…”
mentioning
confidence: 99%
“…Energetically, it would also fit to the oxygen K edge. However, this signal is too weak (intensity of signal only 0.1% above background) and therefore it would only correspond to a handful of atoms30. Although the detection of carbon appears to be trivial, because the Au-X cuboid is directly located on top of the multilayer graphene substrate, the exclusion of all other reasonable elements justifies the conclusion that carbon must be the only constituent element in addition to gold.…”
Section: Resultsmentioning
confidence: 99%
“…At an e‐beam energy of 200 or 300 keV, commonly utilised in TEM, light and medium atomic weight elements that constitute the vast majority of molecular compounds are highly susceptible to ejection. However, a sharp decrease of σ d for most elements when the energy of the e‐beam is lowered has the consequence that most of the studies on carbon‐based materials in an aberration‐corrected TEM are nowadays performed at voltages of 80 kV or 60 kV and even below …”
Section: Introductionmentioning
confidence: 99%