2001
DOI: 10.1016/s0025-5408(01)00741-3
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Simultaneous Rietveld refinement of three phases in the Ag-In-S semiconducting system from X-ray powder diffraction

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Cited by 72 publications
(44 citation statements)
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“…The very slight decrease in the value of the lattice constant as annealing temperature is raised may be attributed to the re-orientation of the crystallites in the preferable direction. The values still strongly agree with that reported for thin film and single crystals as well [6][7][8]11,12].…”
Section: Resultssupporting
confidence: 90%
“…The very slight decrease in the value of the lattice constant as annealing temperature is raised may be attributed to the re-orientation of the crystallites in the preferable direction. The values still strongly agree with that reported for thin film and single crystals as well [6][7][8]11,12].…”
Section: Resultssupporting
confidence: 90%
“…The crystallographic parameters and the melting points of the initial compounds and of the intermediate compounds of the quasi-binary systems are summarized in Table 1 [18][19][20][21][22][23][24][25][26][27][28][29][30][31][32][33][34][35][36][37]. The Ag 2 S-SiS 2 and Ag 2 S-GeS 2 systems were studied repeatedly, therefore the literature data on the crystal structure of the ternary compounds and phase diagrams of these systems are quite dissimilar.…”
Section: Bibliographic Information On the Quasi-binary Systemsmentioning
confidence: 99%
“…Both AgGaS 2 and AgInS 2 are the I-III-VI family with the chalcopyrite structure. 20,24 A difference between the compounds is the larger lattice constants for AgInS 2 by 0.1188 and 0.8971 A in the a and c axes, respectively. Therefore, we compared the Ga K-edge XANES of AgGaS 2 in its own lattice with that of AgGaS 2 in the AgInS 2 lattice.…”
Section: A Solid Solution Between Aggas 2 and Aginsmentioning
confidence: 99%